Efficient cross-section preparation method for high-resolution imaging of hard polymer composites with a scanning electron microscope

2015 ◽  
Vol 260 (2) ◽  
pp. 117-124 ◽  
Author(s):  
N. BRODUSCH ◽  
M. YOURDKHANI ◽  
P. HUBERT ◽  
R. GAUVIN
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Polymer Composites ◽  
Cross Section ◽  
Preparation Method ◽  
High Resolution Imaging ◽  
Hard Polymer ◽  
Resolution Imaging ◽  
Scanning Electron

FIB Enhancement of Mechanically Polished Cross-sections

2019 ◽  
Author(s):  
Becky Holdford
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Cross Sections ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
High Resolution Imaging ◽  
Chemical Attack ◽  
Resolution Imaging ◽  
Scanning Electron

Abstract On mechanically polished cross-sections, getting a surface adequate for high-resolution imaging is sometimes beyond the analyst’s ability, due to material smearing, chipping, polishing media chemical attack, etc.. A method has been developed to enable the focused ion beam (FIB) to re-face the section block and achieve a surface that can be imaged at high resolution in the scanning electron microscope (SEM).

scholarly journals A Study on Biological Sample Preparation for High Resolution Imaging of Scanning Electron Microscope

2020 ◽  
Vol 1447 ◽  
pp. 012034
Author(s):  
Siti Rahmah Aid ◽  
Nik Nur Anis Awadah Nik Zain ◽  
Nur Nadhirah Mohd Rashid ◽  
Hirofumi Hara ◽  
Kamyar Shameli ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Sample Preparation ◽  
Biological Sample ◽  
High Resolution Imaging ◽  
Resolution Imaging ◽  
Scanning Electron

scholarly journals Combining Focused Ion Beam and Scanning Electron Microscopy for IC Fab Support and Defect Review

1996 ◽  
Vol 4 (3) ◽  
pp. 18-19
Author(s):  
Janet Tashima ◽  
Jay Lindquist
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
The Other ◽  
High Resolution Imaging ◽  
Resolution Imaging ◽  
Twin Beam ◽  
Edge Tool ◽  
Scanning Electron

The cutting-edge tool for IC fab support and defect review brings together the Focused Ion Beam (FIB) technology with the Scanning Electron Microscope (SEM) into a single workstation. The twin beam FIB/SEM workstation, FEI Company's DualBeam™ 820 for example, combines the unique micromachining, microdeposition, and analysis capabilities of a FIB with the high resolution imaging power of a Schottky field emission scanning electron microscope (FE SEM). The full functionality of both instruments is available and neither is compromised by the other.

scholarly journals High-Resolution Imaging of Dried and Living Single Bacterial Cell Surfaces: Artifact or Not?

2011 ◽  
Vol 19 (5) ◽  
pp. 22-25 ◽  
Author(s):  
Dominik Greif ◽  
Daniel Wesner ◽  
Dario Anselmetti ◽  
Jan Regtmeier
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Metal Coating ◽  
Environmental Scanning ◽  
Cell Surfaces ◽  
Critical Point Drying ◽  
Resolution Imaging ◽  
Sem Imaging ◽  
Scanning Electron

When studying highly resolved scanning electron microscope images of cell surfaces, the question arises, whether the observed patterns are real or just artifacts of the cell preparation process. The following steps are usually necessary for preparation: fixation, drying, and metal coating. Each step might introduce different artifacts. Clever techniques have been developed to dry cells as gently as possible, for example critical point drying with different organic solvents and CO2. Instrument manufacturers also have taken account of this issue, for example, through the realization of the environmental scanning electron microscope (ESEM), operating with a low-vacuum environment saturated with water so that samples might stay hydrated. Another approach is the extreme high-resolution scanning electron microscope (XHR SEM), where the electron beam is decelerated shortly before reaching the sample. This technique requires no metal coating of the sample. Cryo-SEM also may be used, where no sample preparation is required beyond freezing in a high-pressure freezer or other cryo-fixation device. Then the cell can be examined in the frozen, hydrated state using a cryostage. However, at least some kind of preparation is necessary for SEM imaging, and we wanted to find out what changes the preparation makes on the cell surface.

Microstructure and Mechanical Properties of Cement Mortar Incorporate with Coated Expanded Polystyrene Beads

2017 ◽  
Vol 888 ◽  
pp. 234-238 ◽  
Author(s):  
Izwan Johari ◽  
Amri Hamid ◽  
Shah Rizal Kasim ◽  
Zainal Arifin Ahmad
Keyword(s):  
Mechanical Properties ◽  
Electron Microscope ◽  
High Resolution ◽  
Cement Mortar ◽  
Expanded Polystyrene ◽  
High Resolution Imaging ◽  
Interfacial Surface ◽  
Bonding Properties ◽  
Resolution Imaging ◽  
Scanning Electron

Abstract. Coated Expanded polystyrene (CEPS) mortar is a new lightweight building material that demonstrate a good mechanical properties by improving it interfacial bonding properties. By using the field emission scanning electron microscope (FESEM) with high resolution imaging, the mortar morphology at different ages (7, 14 and 28 days) can be observed. The results shows that coated EPS bead provide a good bonding as there is no gap in the interfacial surface at 28 days.

Research On Method of Discovering Second Phase Particles with Scanning Electron Microscope

2011 ◽  
Vol 287-290 ◽  
pp. 1061-1064
Author(s):  
Xue Gang Ma ◽  
Rong Li Sang ◽  
Yuan Liang Li ◽  
Yi Shen
Keyword(s):  
Electron Microscope ◽  
Chemical Composition ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Lower Cost ◽  
Preparation Method ◽  
Second Phase ◽  
Second Phase Particles ◽  
Tem Method ◽  
Scanning Electron

The microphotograph, size distribution and chemical composition of second phase particles in Q195 steel were characterizated using SEM and EDS. In order to observe the nanometer grade second phase particles, SEM with high resolution should be used. Whether can be second phase particles discovered lies on the preparation method of samples. This method is easier for sample preparation, lower cost, more efficient than TEM method.

A Miniature Low Voltage SEM with High Resolution

1999 ◽  
Vol 5 (S2) ◽  
pp. 322-323
Author(s):  
J.M. Krans ◽  
T.L. van Rooy
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Low Voltage ◽  
Optical Systems ◽  
Objective Lens ◽  
Secondary Electrons ◽  
Voltage Imaging ◽  
Resolution Imaging ◽  
Scanning Electron

Miniaturization of electron optical systems has gained much interest over the last decade [1,2]. In a scanning electron microscope, downscaling of the column dimensions is expected to allow for high resolution imaging at low electron beam voltage. Main advantages of low voltage imaging are lower penetration depth, increased secondary electron yield, less specimen charging and better topographic contrast [3].We have developed a miniature scanning electron microscope (SEM) with high resolution at low beam energies. The outer dimensions of the miniaturized SEM column are 25 mm diameter and 95 mm length, including conventional field emitter electron source module. The column prototype is shown in Fig. 1. The size reduction has been achieved by the exclusive implementation of electrostatic column components. Electron optical simulations indicate that the retarding objective lens of the miniature SEM allows for a probe resolution of 3 nm at 1 keV beam energy. The secondary electrons are collected at an internal scintillator detector.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Sign in / Sign up

Export Citation Format

Share Document