scholarly journals Development of U–Pb dating of uraninite using a secondary ion mass spectrometer: Selection of reference material and establishment of calibration method

Island Arc ◽  
2019 ◽  
Vol 28 (5) ◽  
Author(s):  
Kenji Horie ◽  
Hiroshi Hidaka
Keyword(s):  
Reference Material ◽  
Mass Spectrometer ◽  
Calibration Method ◽  
Secondary Ion ◽  
Selection Of

ICP-MS AND ICP-AES ANALYSIS OF PLANT REFERENCE MATERIALS

2019 ◽  
Vol 85 (6) ◽  
pp. 11-24
Author(s):  
I. V. Nikolaeva ◽  
A. A. Kravchenko ◽  
S. V. Palessky ◽  
S. V. Nechepurenko ◽  
D. V. Semenova
Keyword(s):  
Reference Material ◽  
Mass Spectrometer ◽  
Reference Materials ◽  
Atomic Emission ◽  
Icp Ms ◽  
Lithium Metaborate ◽  
Relative Standard ◽  
Microwave System ◽  
Total Analysis ◽  
Siberian Pine

Two methods — ICP-MS and ICP-AES are used for certification of the new reference material — needles of Siberian pine (NSP-1). Techniques of the analysis include decomposition of plant samples in two different ways: acid digestion in a microwave system MARS-5 and lithium metaborate fusion followed by ICP-MS and ICP-AES analysis of the solutions. Simultaneous determinations of all the elements were carried out in low, medium and high resolution using SF-mass-spectrometer ELEMENT and atomic-emission spectrometer IRIS Advantage with external calibrations and internal standards (In — ICP-MS, Sc —ICP-AES). Middle and high resolutions of ICP mass spectrometer were used for interference corrections. Data obtained by ICP-MS and ICP-AES with different decomposition techniques are in good agreement. The ICP-MS and ICP-AES techniques have been validated by the analysis of three plant reference materials: LB-1 (leaf of a birch), Tr-1 (grass mixture) and EK-1 (Canadian pondweed). These techniques were used for the determination of 38 elements in the new reference material NSP-1. Relative standard deviations for most of the determined elements were below 10%. Combination of ICP-MS and ICP-AES techniques for certification of the new reference material makes it possible to expand the set of elements to be determined and to reduce the total analysis time.

Calibration Method for Elemental Quantification

2000 ◽  
Vol 6 (S2) ◽  
pp. 536-537
Author(s):  
C. B. Vartuli ◽  
F. A. Stevie ◽  
L. A. Giannuzzi ◽  
T. L. Shofner ◽  
B. M. Purcell ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Peak Concentration ◽  
Energy Dispersive Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Rutherford Backscattering Spectrometry ◽  
Calibration Method ◽  
High Dose ◽  
High Concentration ◽  
Borophosphosilicate Glass ◽  
Secondary Ion

Energy Dispersive Spectrometry (EDS) is generally calibrated for quantification using elemental standards. This can introduce errors when quantifying non-elemental samples and does not provide an accurate detection limit. In addition, variations between analysis tools can lead to values that differ considerably, especially for trace elements. By creating a standard with an exact trace composition, many of the errors inherent in EDS quantification measurements can be eliminated.The standards are created by high dose ion implantation. For ions implanted into silicon, a dose of 1E16 cm-2 results in a peak concentration of approximately 1E21 cm-3 or 2% atomic. The exact concentration can be determined using other methods, such as Rutherford Backscattering Spectrometry (RBS) or Secondary Ion Mass Spectrometry (SIMS). For this study, SIMS analyses were made using a CAMECA IMS-6f magnetic sector. Measurement protocols were used that were developed for high concentration measurements, such as B and P in borophosphosilicate glass (BPSG).

scholarly journals Impact and Correction of Analytical Positioning on Accuracy of Zircon U-Pb Dating by SIMS

2020 ◽  
Vol 8 ◽  
Author(s):  
Yu Liu ◽  
Qiu-Li Li ◽  
Xiao-Xiao Ling ◽  
Guo-Qiang Tang ◽  
Jiao Li ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Position Effect ◽  
Calibration Method ◽  
Complex Structures ◽  
Calibration Protocol ◽  
Single Zircon ◽  
Left And Right ◽  
Analytical Tools ◽  
Secondary Ion

Secondary ion mass spectrometry (SIMS) is one of the most important analytical tools for geochronology, especially for zircon U-Pb dating. Due to its advantages in spatial resolution and analytical precision, SIMS is the preferred option for multi-spot analyses on single zircon grain with complex structures. However, whether or how much the relative positions of multiple analytical spots on one zircon grain affect the U-Pb age accuracy is an important issue that has been neglected by most researchers. In this study, we carried out a series of investigation on the influence of relative analytical position during zircon U-Pb age analyses, using Cameca IMS 1280-HR instrument. The results demonstrated a significant influence on the second spot, with apparent U-Pb age deviation as high as around 10% especially on the left and right side with overlap in the raster area. Nevertheless, a linear correlation between a secondary ion centering parameter (DTCA-X) and age deviation in percentage terms was found, and a calibration method was established to correct this position effect. Four zircon standards (91500, M257, TEMORA-2, and Plešovice) were measured to prove the reliability of the established procedure. The original U-Pb apparent data show inconsistent deviation on four directions relative to the datum, while the final U-Pb age results is calibrated to be consistent with their recommended values, within uncertainties of ~1%. This work calls for re-examination for the previous SIMS U-Pb dating results on core-rim dating strategy, and provides a calibration protocol to correct the relative position effect.

Based on the Experimental Platform of Litchi Picking Vision Calibration

2013 ◽  
Vol 462-463 ◽  
pp. 978-983
Author(s):  
Jiang Zhou Zhang ◽  
Jian Feng Zhang ◽  
Ji Zhong Deng
Keyword(s):  
Binocular Vision ◽  
Calibration Method ◽  
Feature Points ◽  
Camera Model ◽  
Reference Coordinate System ◽  
Experimental Platform ◽  
Hardware System ◽  
Mechanical Hand ◽  
Planar Pattern ◽  
Selection Of

This paper constructs the picking mechanical hand binocular vision hardware system. Using an internal and external parameters calibration method of separation. In the calibration process, with calibration planar pattern translatory manner, appropriate for extracting feature points in the calibration template, through experiment and calculation to obtain the accurate parameters of camera model; external parameters calibration is a reasonable selection of reference coordinate system, through experimental analysis to obtain the two cameras outside parameter model.

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