An Improved In Situ Zircon U‐Pb Dating Method at High Spatial Resolution (≤ 10 μm spot) by LA‐MC‐ICP‐MS and its Application

2021 ◽  
Author(s):  
Meng Lin ◽  
Guibin Zhang ◽  
Nan Li ◽  
Huijuan Li ◽  
Jiaxing Wang
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Icp Ms ◽  
Dating Method

High spatial resolution in situ U–Pb dating using laser ablation multiple ion counting inductively coupled plasma mass spectrometry (LA-MIC-ICP-MS)

2017 ◽  
Vol 32 (5) ◽  
pp. 975-986 ◽  
Author(s):  
Lie-Wen Xie ◽  
Jin-Hui Yang ◽  
Qing-Zhu Yin ◽  
Yue-Heng Yang ◽  
Jing-Bo Liu ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Inductively Coupled Plasma ◽  
High Spatial Resolution ◽  
Zircon Age ◽  
Analytical Technique ◽  
Inductively Coupled ◽  
Rapid Measurement ◽  
Icp Ms ◽  
Plasma Mass Spectrometry

A new LA-MIC-ICP-MS analytical technique has been developed for the rapid measurement of 206Pb/238U zircon age (<1%, 2s) at a high spatial resolution. We show that this technique can be routinely employed to date U–Pb in small and/or complex zircons, providing a powerful tool for geochronology.

In situ measurement of redox sensitive solutes at high spatial resolution in a riverbed using Diffusive Equilibrium in Thin Films (DET)

2012 ◽  
Vol 49 ◽  
pp. 18-26 ◽  
Author(s):  
Sami Ullah ◽  
Hao Zhang ◽  
A. Louise Heathwaite ◽  
Andrew Binley ◽  
Katrina Lansdown ◽  
...  
Keyword(s):  
Thin Films ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
In Situ Measurement

scholarly journals HOLIMO II: a digital holographic instrument for ground-based in-situ observations of microphysical properties of mixed-phase clouds

2013 ◽  
Vol 6 (3) ◽  
pp. 4183-4221 ◽  
Author(s):  
J. Henneberger ◽  
J. P. Fugal ◽  
O. Stetzer ◽  
U. Lohmann
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Mixed Phase ◽  
Size Spectrum ◽  
Research Station ◽  
Resolution Limit ◽  
Microphysical Properties ◽  
Cloud Particles ◽  
Mixed Phase Clouds

Abstract. Measurements of the microphysical properties of mixed-phase clouds with high spatial resolution are important to understand the processes inside these clouds. This work describes the design and characterization of the newly developed ground-based field instrument HOLIMO II (HOLographic Imager for Microscopic Objects II). HOLIMO II uses digital in-line holography to in-situ image cloud particles in a well defined sample volume. By an automated algorithm, two-dimensional images of single cloud particles between 6 and 250 μm in diameter are obtained and the size spectrum, the concentration and water content of clouds are calculated. By testing the sizing algorithm with monosized beads a systematic overestimation near the resolution limit was found, which has been used to correct the measurements. Field measurements from the high altitude research station Jungfraujoch, Switzerland, are presented. The measured number size distributions are in good agreement with parallel measurements by a fog monitor (FM-100, DMT, Boulder USA). The field data shows that HOLIMO II is capable of measuring the number size distribution with a high spatial resolution and determines ice crystal shape, thus providing a method of quantifying variations in microphysical properties. A case study over a period of 8 h has been analyzed, exploring the transition from a liquid to a mixed-phase cloud, which is the longest observation of a cloud with a holographic device. During the measurement period, the cloud does not completely glaciate, contradicting earlier assumptions of the dominance of the Wegener–Bergeron–Findeisen (WBF) process.

scholarly journals Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology

2022 ◽  
Vol 17 (1) ◽  
Author(s):  
Chien-Ping Wang ◽  
Burn Jeng Lin ◽  
Pin-Jiun Wu ◽  
Jiaw-Ren Shih ◽  
Yue-Der Chih ◽  
...  
Keyword(s):  
Light Intensity ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Cmos Technology ◽  
Exposure Control ◽  
Storage Node ◽  
Cmos Compatibility ◽  
Time And Energy ◽  
Non Destructive

AbstractAn on-wafer micro-detector for in situ EUV (wavelength of 13.5 nm) detection featuring FinFET CMOS compatibility, 1 T pixel and battery-less sensing is demonstrated. Moreover, the detection results can be written in the in-pixel storage node for days, enabling off-line and non-destructive reading. The high spatial resolution micro-detectors can be used to extract the actual parameters of the incident EUV on wafers, including light intensity, exposure time and energy, key to optimization of lithographic processes in 5 nm FinFET technology and beyond.

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