scholarly journals ‘Box‐Profile’ Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry

2019 ◽  
Vol 43 (4) ◽  
pp. 531-541 ◽  
Author(s):  
Haosheng Wu ◽  
Roman Böttger ◽  
Frédéric Couffignal ◽  
Jens Gutzmer ◽  
Joachim Krause ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Reference Materials ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Geochemical Reference Materials ◽  
Secondary Ion

Secondary Ion Mass Spectrometry Reference Materials for Lithium in Carbonaceous Matrices

2022 ◽  
Author(s):  
Zebadiah Teichert ◽  
Maitrayee Bose ◽  
Peter Williams ◽  
Richard L. Hervig ◽  
Lynda B. Williams
Keyword(s):  
Mass Spectrometry ◽  
Reference Materials ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

H 2 O Content Measurement in Phengite by Secondary Ion Mass Spectrometry: A New Set of Reference Materials

2019 ◽  
Vol 43 (4) ◽  
pp. 635-646 ◽  
Author(s):  
Cindy Luisier ◽  
Lukas Baumgartner ◽  
Guillaume Siron ◽  
Torsten Vennemann ◽  
Martin Robyr
Keyword(s):  
Mass Spectrometry ◽  
Reference Materials ◽  
Secondary Ion Mass Spectrometry ◽  
Content Measurement ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Biotite Reference Materials for Secondary Ion Mass Spectrometry 18 O/16 O Measurements

2016 ◽  
Vol 41 (2) ◽  
pp. 243-253 ◽  
Author(s):  
Guillaume Siron ◽  
Lukas Baumgartner ◽  
Anne-Sophie Bouvier ◽  
Benita Putlitz ◽  
Torsten Vennemann
Keyword(s):  
Mass Spectrometry ◽  
Reference Materials ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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