Low Temperature Back-Surface-Field (BSF) Technology for Crystalline Silicon (c-Si) Thin Film Solar Cells Based on Heterojunctions between Boron-Doped P-Type Hydrogenated Amorphous Silicon and c-Si

Author(s):  
Mitsuyuki Yamanaka ◽  
Isao Sakata ◽  
Ryuichi Shimokawa ◽  
Hidetaka Takato
2019 ◽  
Vol 11 (35) ◽  
pp. 31851-31859 ◽  
Author(s):  
Yanping Song ◽  
Bin Yao ◽  
Yongfeng Li ◽  
Zhanhui Ding ◽  
Huanhuan Sun ◽  
...  

2017 ◽  
Vol 124 ◽  
pp. 384-391 ◽  
Author(s):  
Yuka Tomizawa ◽  
Yoshinori Ikeda ◽  
Haruhiko Itoh ◽  
Takashi Shiro ◽  
Jochen Loffler ◽  
...  

RSC Advances ◽  
2017 ◽  
Vol 7 (43) ◽  
pp. 26776-26782 ◽  
Author(s):  
Fengyou Wang ◽  
Yanbo Gao ◽  
Zhenyu Pang ◽  
Lili Yang ◽  
Jinghai Yang

Interface defects and the back surface field of p-type heterojunction solar cells are investigated for achieving high performance.


Solar Energy ◽  
2020 ◽  
Vol 196 ◽  
pp. 207-216
Author(s):  
Xiaojie Jia ◽  
Fang Lv ◽  
Ping Li ◽  
Wenjing Wang

1991 ◽  
Vol 219 ◽  
Author(s):  
Richard S. Crandall ◽  
Stanley J. Salamon ◽  
Yueqin Xu

ABSTRACTWe derive a closed form expression for differential junction capacitance applicable when the density of states (DOS) varies exponentially with energy. Using this expression, we analyze p/n junction capacitance measurements that probe the DOS in boron doped hydrogenated amorphous silicon and silicon carbide alloy. In both materials we find that the p-layer DOS is described by an exponential increase with energy above the Fermi level.


Sign in / Sign up

Export Citation Format

Share Document