Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive

24th IEEE VLSI Test Symposium ◽

10.1109/vts.2006.34 ◽

2006 ◽

Cited By ~ 5

Author(s):

Ruifeng Guo ◽

S. Mitra ◽

E. Amyeen ◽

Jinkyu Lee ◽

S. Sivaraj ◽

...

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