Effectiveness of I-V testing in comparison to IDDq tests [IC testing]

2003 ◽  
Author(s):  
T.J. Vogels
Keyword(s):  
Ic Testing

Application of a Bayesian network to integrated circuit tester diagnosis

1995 ◽  
Vol 9 (1) ◽  
pp. 51-65 ◽  
Author(s):  
Daniel Mittelstadt ◽  
Robert Paasch ◽  
Bruce D’Ambrosio
Keyword(s):  
Expert System ◽  
Real World ◽  
Integrated Circuit ◽  
Procedural Knowledge ◽  
Knowledge Engineering ◽  
Bayesian Belief Network ◽  
Belief Networks ◽  
Diagnostic Problem ◽  
Ic Testing ◽  
Time Limitations

AbstractResearch efforts to implement a Bayesian belief-network-based expert system to solve a real-world diagnostic problem – the diagnosis of integrated circuit (IC) testing machines – are described. The development of several models of the IC tester diagnostic problem in belief networks also is described, the implementation of one of these models using symbolic probabilistic inference (SPI) is outlined, and the difficulties and advantages encountered are discussed. It was observed that modeling with interdependencies in belief networks simplifies the knowledge engineering task for the IC tester diagnosis problem, by avoiding procedural knowledge and focusing on the diagnostic component’s interdependencies. Several general model frameworks evolved through knowledge engineering to capture diagnostic expertise that facilitated expanding and modifying the networks. However, model implementation was restricted to a small portion of the modeling, that of contact resistance failures, which were due to time limitations and inefficiencies in the prototype inference software we used. Further research is recommended to refine existing methods, in order to speed evaluation of the models created in this research. With this accomplished, a more complete diagnosis can be achieved.

Quantification of Systematic Error in Ic Testing

1991 ◽  
pp. 713-723 ◽  
Author(s):  
Mark J. Erdmann ◽  
Douglas A. Pollock ◽  
D. W. Capone
Keyword(s):  
Systematic Error ◽  
Ic Testing

Application of a Bayesian Network to Integrated Circuit Tester Diagnosis

1994 ◽  
Author(s):  
Daniel Mittelstadt ◽  
Robert Paasch ◽  
Bruce D'Ambrosio
Keyword(s):  
Integrated Circuit ◽  
Procedural Knowledge ◽  
Knowledge Engineering ◽  
Probability Distributions ◽  
Belief Networks ◽  
Diagnostic Problem ◽  
Complete Model ◽  
New Methods ◽  
Ic Testing ◽  
Time Diagnosis

Abstract We describe research efforts to implement a Bayesian belief network based expert system to solve a real-world diagnostic problem — the diagnosis of integrated circuit (IC) testing machines. We describe the development of several models of the IC tester diagnostic problem in belief networks, the implementation of one of these models using Symbolic Probabilistic Inference (SPI), and discuss the difficulties and advantages encountered in the process. We observe that modelling with interdependencies in belief networks simplified the knowledge engineering task for the IC tester diagnosis problem, by avoiding procedural knowledge and focusing on diagnostic component’s interdependencies. Several general model frameworks evolved through knowledge engineering to capture diagnostic expertise that facilitated expanding and modifying the networks. However, model implementation was restricted to a small portion of the modelling, contact resistance failures, because evaluation of the probability distributions could not be made fast enough to expand to a complete model with real-time diagnosis. Further research is recommended to create new methods, or refine existing methods, to speed evaluation of the models created in this research. With this accomplished, a more complete diagnosis can be achieved.

Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing

2019 ◽  
Author(s):  
Yukiko Shibasaki ◽  
Koji Asami ◽  
Anna Kuwana ◽  
Kosuke Machida ◽  
Yuanyang Du ◽  
...  
Keyword(s):  
Crest Factor ◽  
Mixed Signal ◽  
Ic Testing ◽  
Mixed Signal Ic

An FPGA-Based Data Receiver for Digital IC Testing

2019 ◽  
Author(s):  
Wei-Chen Huang ◽  
Guan-Hao Hou ◽  
Jiun-Lang Huang ◽  
Terry Kuo
Keyword(s):  
Ic Testing

Enhancing radical innovation performance through intellectual capital components

2017 ◽  
Vol 18 (4) ◽  
pp. 789-806 ◽  
Author(s):  
Lara Agostini ◽  
Anna Nosella
Keyword(s):  
Intellectual Capital ◽  
Radical Innovation ◽  
Innovation Performance ◽  
Content Type ◽  
Key Factor ◽  
Ic Testing ◽  
And Performance ◽  
The Impact ◽  
The Relationship

Purpose In today’s knowledge economy the ability to innovate and develop new products is a key factor to sustain firm performance. Within this context, analysing the role of different components of intellectual capital (IC) becomes of foremost importance, as well as an under-investigated issue for small- and medium-sized enterprises (SMEs). The purpose of this paper is to investigate the impact of human, organisational and relational capital (RC) on radical innovation performance (RIP), as well as to examine whether organisational capital (OC) and RC mediate the relationship between human capital (HC) and RIP and whether OC moderates the relationship between RC and RIP. Design/methodology/approach The methodology consisted of a factor analysis and different regression models to test for mediation and moderation. The analyses are carried out on a sample of 150 micro firms and SMEs involved in the production of machinery or instruments and located in Italy. Findings Results show that HC is directly associated to RIP, as well as OC and RC that totally mediate the relationship between HC and RIP. Moreover, OC positively moderates the relationship between RC and RIP. Originality/value This study is particularly interesting because it adopts an overarching perspective on IC testing the interplay between the different components of IC. In addition, it focusses on the SME context which is under-investigated as far as IC and performance measurement is concerned.

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