Cold delay defect screening

Proceedings 18th IEEE VLSI Test Symposium ◽

10.1109/vtest.2000.843843 ◽

2002 ◽

Cited By ~ 20

Author(s):

Chao-Wen Tseng ◽

E.J. Mccluskey ◽

Xiaoping Shao ◽

D.M. Wu

Download Full-text