Guest Editorial Special Section on the 2015 IEEE International Conference on Microelectronic Test Structures (ICMTS)

Colin Mcandrew

doi:10.1109/tsm.2016.2590726

Guest Editorial Special Section on the 2015 IEEE International Conference on Microelectronic Test Structures (ICMTS)

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2016.2590726 ◽

2016 ◽

Vol 29 (3) ◽

pp. 183-184 ◽

Cited By ~ 1

Author(s):

Colin Mcandrew

Keyword(s):

Guest Editorial ◽

Special Section ◽

International Conference ◽

Ieee International Conference

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Guest Editorial: Special Section on IEEE International Conference on Software Quality, Reliability, and Security (QRS) 2020

IEEE Transactions on Reliability ◽

10.1109/tr.2021.3083119 ◽

2021 ◽

Vol 70 (2) ◽

pp. 442-442

Author(s):

W. K. Chan ◽

Mei Nagappan ◽

Christof Budnik

Keyword(s):

Software Quality ◽

Guest Editorial ◽

Special Section ◽

International Conference ◽

Ieee International Conference

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Guest Editorial Special Section on 2019 IEEE International Conference on Automation Science and Engineering

IEEE Transactions on Automation Science and Engineering ◽

10.1109/tase.2020.3029310 ◽

2021 ◽

Vol 18 (1) ◽

pp. 216-217

Author(s):

Jingshan Li ◽

Weiming Shen

Keyword(s):

Guest Editorial ◽

Special Section ◽

Science And Engineering ◽

International Conference ◽

Ieee International Conference

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Guest Editorial Special Section on the IEEE International Conference on Microelectronic Test Structures

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2017.2728938 ◽

2017 ◽

Vol 30 (3) ◽

pp. 190-191

Author(s):

Yoshio Mita ◽

Stewart Smith

Keyword(s):

Guest Editorial ◽

Special Section ◽

International Conference ◽

Ieee International Conference

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Guest Editorial Foreword to Special Section on 2017 IEEE International Conference on Computational Electromagnetics (ICCEM2017)

IEEE Journal on Multiscale and Multiphysics Computational Techniques ◽

10.1109/jmmct.2017.2780458 ◽

2017 ◽

Vol 2 ◽

pp. 209-209

Author(s):

Takeshi Fukusako ◽

Dan Jiao ◽

Shinichiro Ohnuki

Keyword(s):

Guest Editorial ◽

Special Section ◽

Computational Electromagnetics ◽

International Conference ◽

Ieee International Conference ◽

Editorial Foreword

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Guest Editorial - Special Section on the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2006.884597 ◽

2006 ◽

Vol 19 (4) ◽

pp. 370-371

Keyword(s):

Guest Editorial ◽

Special Section ◽

International Conference

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Guest Editorial: Special section on the selected papers from 14th International Conference on Evaluation and Assessment in Software Engineering (EASE 2010)

Information and Software Technology ◽

10.1016/j.infsof.2010.12.008 ◽

2011 ◽

Vol 53 (6) ◽

pp. 615

Author(s):

Mahmood Niazi ◽

Mark Turner

Keyword(s):

Software Engineering ◽

Guest Editorial ◽

Special Section ◽

International Conference ◽

Evaluation And Assessment

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Guest Editorial: IEEE International Conference on Bioinformatics and Biomedicine (BIBM 2014) Special Issue

IEEE Transactions on NanoBioscience ◽

10.1109/tnb.2015.2446091 ◽

2015 ◽

Vol 14 (5) ◽

pp. 498-499

Author(s):

Xiaohua Hu ◽

Yadong Wang

Keyword(s):

Guest Editorial ◽

Special Issue ◽

International Conference ◽

International Conference On Bioinformatics ◽

Ieee International Conference

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Guest Editorial Special Section on the 2018 International Conference on Compound Semiconductor Manufacturing Technology (CS-MANTECH)

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2018.2873469 ◽

2018 ◽

Vol 31 (4) ◽

pp. 411-412

Author(s):

Drew Hanser ◽

Patrick Fay

Keyword(s):

Semiconductor Manufacturing ◽

Guest Editorial ◽

Special Section ◽

Compound Semiconductor ◽

Manufacturing Technology ◽

International Conference

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Guest Editorial Special Section on the International Conference on Microelectronic Test Structures

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2004.826931 ◽

2004 ◽

Vol 17 (2) ◽

pp. 77-78

Author(s):

B. Verzi ◽

A.J. Walton

Keyword(s):

Guest Editorial ◽

Special Section ◽

International Conference

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Guest Editorial Special Section on the International Conference on Microelectronic Test Structures

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2005.845013 ◽

2005 ◽

Vol 18 (2) ◽

pp. 237-237

Author(s):

N. Kasai

Keyword(s):

Guest Editorial ◽

Special Section ◽

International Conference

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