Planar on-chip flow cytometer using evanescent waves based on liquid total internal reflection (L-TIR)

2011 ◽  
Author(s):  
H. Huang ◽  
X. M. Ji ◽  
J. Zhou ◽  
T. J. Huang ◽  
Y. P. Huang
Keyword(s):  
Total Internal Reflection ◽  
Evanescent Waves ◽  
Flow Cytometer ◽  
Internal Reflection ◽  
Chip Flow ◽  
On Chip

scholarly journals In-line characterization and identification of micro-droplets on-chip

2014 ◽  
Vol 1 (1) ◽  
Author(s):  
Emanuel Weber ◽  
Dietmar Puchberger-Enengl ◽  
Franz Keplinger ◽  
Michael J. Vellekoop
Keyword(s):  
Total Internal Reflection ◽  
Monochromatic Light ◽  
Microfluidic Channel ◽  
Internal Reflection ◽  
Droplet Volume ◽  
Generation Frequency ◽  
On Chip ◽  
Solid Liquid Interface ◽  
Solid Liquid

AbstractWe present an integrated optofluidic sensor system for in-line characterization of micro-droplets. The device provides information about the droplet generation frequency, the droplet volume, and the content of the droplet. Due to its simplicity this principle can easily be implemented with other microfluidic components on one and the same device. The sensor is based on total internal reflection phenomena. Droplets are pushed through a microfluidic channel which is hit by slightly diverging monochromatic light. At the solid-liquid interface parts of the rays experience total internal reflection while another part is transmitted. The ratio of reflected to transmitted light depends on the refractive index of the solution. Both signals are recorded simultaneously and provide a very stable output signal for the droplet characterization. With the proposed system passing droplets were counted up to 320 droplets per second and droplets with different volumes could be discriminated. In a final experiment droplets with different amounts of dissolved CaCl

Single-layer planar on-chip flow cytometer using microfluidic drifting based three-dimensional (3D) hydrodynamic focusing

Lab on a Chip ◽  
2009 ◽  
Vol 9 (11) ◽  
pp. 1583 ◽  
Author(s):  
Xiaole Mao ◽  
Sz-Chin Steven Lin ◽  
Cheng Dong ◽  
Tony Jun Huang
Keyword(s):  
Three Dimensional ◽  
Single Layer ◽  
Flow Cytometer ◽  
Hydrodynamic Focusing ◽  
Chip Flow ◽  
On Chip

FOURIER-INTEGRAL DESCRIPTION OF SUPERLUMINAL PHOTON TUNNELING

2000 ◽  
Vol 14 (04) ◽  
pp. 109-117 ◽  
Author(s):  
FABIO CARDONE ◽  
ROBERTO MIGNANI ◽  
VLADYSLAV S. OLKHOVSKY
Keyword(s):  
Total Internal Reflection ◽  
Previous Treatment ◽  
Fourier Integral ◽  
Optical Devices ◽  
Evanescent Waves ◽  
Internal Reflection ◽  
Frustrated Total Internal Reflection ◽  
Photon Tunneling

We give a general Fourier-integral description of photon tunneling which can be applied either to electromagnetic waveguides and to optical devices. Moreover, we extend to the case of frustrated total internal reflection our previous treatment of superluminal tunneling of evanescent waves in terms of a spacetime deformation.

Comparison of sensitivity of the refractometric methods of frustrated total internal reflection and surface plasmon resonance

2020 ◽  
pp. 44-49
Author(s):  
I. N. Pavlov
Keyword(s):  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Total Internal Reflection ◽  
Resonance Method ◽  
Internal Reflection ◽  
Optical Methods ◽  
Thin Boundary Layer ◽  
Experimental Conditions ◽  
Frustrated Total Internal Reflection

Two optical methods, namely surface plasmon resonance imaging and frustrated total internal reflection, are described in the paper in terms of comparing their sensitivity to change of refractive index of a thin boundary layer of an investigated medium. It is shown that, despite the fact that the theoretically calculated sensitivity is higher for the frustrated total internal reflection method, and the fact that usually in practice the surface plasmon resonance method, on the contrary, is considered more sensitive, under the same experimental conditions both methods show a similar result.

Achromatic Total Internal Reflection Prism in DLP Projection System

2019 ◽  
pp. 1279
Author(s):  
Ya-Chi Lu ◽  
Jhong-Syuan Li ◽  
Kao-Der Chang ◽  
Shie-Chang Jeng ◽  
Jui-Wen Pan
Keyword(s):  
Total Internal Reflection ◽  
Internal Reflection ◽  
Projection System
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