Design of Efficient Second-Order Spectral-Null Codes

2005 ◽  
Vol 51 (4) ◽  
pp. 1580-1584 ◽  
Author(s):  
C.-N. Yang
Keyword(s):  
Second Order ◽  
Spectral Null

Efficient Encoding/Decoding for Second-Order Spectral-Null Codes by Reducing Random Walks

2011 ◽  
Vol 60 (10) ◽  
pp. 1503-1510 ◽  
Author(s):  
Ching-Nung Yang ◽  
Chih-Yang Chiu ◽  
Gen-Chin Wu
Keyword(s):  
Random Walks ◽  
Second Order ◽  
Spectral Null

scholarly journals Efficient Non-Recursive Design of Second-Order Spectral-Null Codes

2016 ◽  
Vol 62 (6) ◽  
pp. 3084-3102 ◽  
Author(s):  
Luca G. Tallini ◽  
Danilo Pelusi ◽  
Raffaele Mascella ◽  
Laura Pezza ◽  
Samir Elmougy ◽  
...  
Keyword(s):  
Second Order ◽  
Recursive Design ◽  
Spectral Null

On efficient second-order spectral-null codes using sets of m1-balancing functions

2013 ◽  
Author(s):  
Raffaele Mascella ◽  
Danilo Pelusi ◽  
Laura Pezza ◽  
Samir Elmougy ◽  
Luca G. Tallini ◽  
...  
Keyword(s):  
Second Order ◽  
Spectral Null

Some new efficient second-order spectral-null codes with small lookup tables

2006 ◽  
Vol 55 (7) ◽  
pp. 924-927 ◽  
Author(s):  
Ching-Nung Yang ◽  
Dong-Jing Lee
Keyword(s):  
Second Order ◽  
Lookup Tables ◽  
Spectral Null

Reducing Code Length of Second-Order Spectral-Null Code

2015 ◽  
Vol 64 (2) ◽  
pp. 492-503 ◽  
Author(s):  
Ching-Nung Yang ◽  
Zih-Yang Lin ◽  
Sheng-Lung Peng
Keyword(s):  
Second Order ◽  
Code Length ◽  
Spectral Null

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

Sign in / Sign up

Export Citation Format

Share Document