Arc-Support Line Segments Revisited: An Efficient High-Quality Ellipse Detection

2020 ◽  
Vol 29 ◽  
pp. 768-781 ◽  
Author(s):  
Changsheng Lu ◽  
Siyu Xia ◽  
Ming Shao ◽  
Yun Fu
Keyword(s):  
Support Line ◽  
High Quality ◽  
Line Segments ◽  
Ellipse Detection

Detection of the abnormal landmarks in case of geodesic orientation phototriangulations

2017 ◽  
Vol 920 (2) ◽  
pp. 42-45
Author(s):  
O.N. Levitskaya ◽  
V.V. Pogorelov
Keyword(s):  
Gradual Increase ◽  
Perpendicular Direction ◽  
Task Completion ◽  
Practical Application ◽  
High Quality ◽  
Line Segments ◽  
The Real

When building phototriangulation ways to identify landmarks with gross blu nders in planning coordinates or their identification. They are based on an assessment of the condition of the equality the scale of line segments connecting the landmarks. However, in this case, there is the possibility of detecting a blunder in the situation of landmarks only in the direction of the segment. The article considers a method of detecting a blunder in the situation of landmarks also in the perpendicular direction to the cut. This assessed the condition of equal angles between identical segments. It is shown that as the scale and angles are invariants of orthogonal transformations, it is advisable to apply them as criteria to stage the planned reduction of phototriangulation. In the process of analysis of the quality of landmarks reveals the real level of error plane coordinate landmarks. This treatment begins with a task notoriously tough admission, which excludes high-quality landmarks. Then follows a gradual increase in the tolerance. As a criterion for task completion is assumed that the correct project build the mapping component of the anomalous landmarks should not exceed a certain level in the order of 10 - 15 percent. An example of the practical application of the method when building a phototriangulation for the images of TK-350, scale 1

Fast Depth Generating Algorithm From Binocular Images

2013 ◽  
Vol 284-287 ◽  
pp. 3102-3105
Author(s):  
Fang Hsuan Cheng ◽  
Tzu Hao Kuo
Keyword(s):  
Edge Detection ◽  
Line Segment ◽  
Stereo Matching ◽  
Color Difference ◽  
Experimental Results ◽  
Reference Image ◽  
Depth Information ◽  
High Quality ◽  
Line Segments

This paper proposes a line segment method to estimate the depth information from a pair of rectified images. The proposed method can achieve fast and high quality stereo-matching. This method first uses a simple edge detection to find out the line segments in the reference image and then calculates the color difference of each line segment from binocular images. The last step is to find out the minimum difference of each line segment as the corresponding points. From the experimental results, it is proved that the proposed method can fast and accurately generate the depth information from binocular images.

Detecting Ellipses in Embryo Images Using Arc Detection Method with Particle Swarm for Blastomere-Quality Measurement System

2016 ◽  
Vol 20 (7) ◽  
pp. 1170-1180 ◽  
Author(s):  
Aprinaldi Jasa Mantau ◽  
◽  
Anom Bowolaksono ◽  
Budi Wiweko ◽  
Wisnu Jatmiko ◽  
...  
Keyword(s):  
Fitness Function ◽  
Particle Swarm ◽  
Quality Measurement ◽  
Detection Methods ◽  
Vitro Fertilization ◽  
Line Segments ◽  
Ellipse Detection ◽  
Starting Point ◽  
Novel Method

The objective of this paper is to present a novel method, based on a swarm intelligence algorithm, for ellipse detection in digital images of embryo. The process is carried out in several stages. First, edge detection is performed on the image. Then, line segments in the image are detected, and potential elliptical arc segments are extracted from the line segments. Afterward, the detection process is carried out using the Particle Swarm Optimization (PSO) method, which utilize the calculation of the fitness function from the arc segment previously detected. The PSO technique, which is the idea behind the proposed algorithm, is used to find the actual ellipses by combining potential elliptical arcs. The best combination of potential arcs is determined by means a voting technique that utilizes three important points on the arc, namely the starting point, midpoint, and endpoint, so the voting is more efficient than doing the voting for every single pixel in the image. Furthermore, this method is used an embryo image that has following the characteristics: multiple ellipses, a lot of noise, an incomplete ellipse, low image contrast, and overlapping cells. Experiment show that the proposed method detects the ellipses better than do several voting-based ellipse detection methods such as RHT, IRHT, and PSORHT. On the other hand, the experiments show that the proposed method has a higher average hit rate than do other methods. This research is used to increase the success rate of In-Vitro Fertilization (IVF).

scholarly journals A Fast and Robust Ellipse-Detection Method Based on Sorted Merging

2014 ◽  
Vol 2014 ◽  
pp. 1-15 ◽  
Author(s):  
Gangyi Wang ◽  
Guanghui Ren ◽  
Zhilu Wu ◽  
Yaqin Zhao ◽  
Lihui Jiang
Keyword(s):  
Detection Method ◽  
Semimajor Axis ◽  
High Accuracy ◽  
Ellipse Fitting ◽  
Line Segments ◽  
Ellipse Detection ◽  
Fitting Method ◽  
Merging Process ◽  
Real Time Applications ◽  
Merging Strategy

A fast and robust ellipse-detection method based on sorted merging is proposed in this paper. This method first represents the edge bitmap approximately with a set of line segments and then gradually merges the line segments into elliptical arcs and ellipses. To achieve high accuracy, a sorted merging strategy is proposed: the merging degrees of line segments/elliptical arcs are estimated, and line segments/elliptical arcs are merged in descending order of the merging degrees, which significantly improves the merging accuracy. During the merging process, multiple properties of ellipses are utilized to filter line segment/elliptical arc pairs, making the method very efficient. In addition, an ellipse-fitting method is proposed that restricts the maximum ratio of the semimajor axis and the semiminor axis, further improving the merging accuracy. Experimental results indicate that the proposed method is robust to outliers, noise, and partial occlusion and is fast enough for real-time applications.

Circle detection by arc-support line segments

2017 ◽  
Author(s):  
Changsheng Lu ◽  
Siyu Xia ◽  
Wanming Huang ◽  
Ming Shao ◽  
Yun Fu
Keyword(s):  
Support Line ◽  
Circle Detection ◽  
Line Segments

Some problems of objective-prism spectra classification

1966 ◽  
Vol 24 ◽  
pp. 51-52
Author(s):  
E. K. Kharadze ◽  
R. A. Bartaya
Keyword(s):  
Short Wave ◽  
High Quality ◽  
Stellar Spectra ◽  
Objective Prism

The unique 70-cm meniscus-type telescope of the Abastumani Astrophysical Observatory supplied with two objective prisms and the seeing conditions characteristic at Mount Kanobili (Abastumani) permit us to obtain stellar spectra of a high quality. No additional design to improve the “climate” immediately around the telescope itself is being applied. The dispersions and photographic magnitude limits are 160 and 660Å/mm, and 12–13, respectively. The short-wave end of spectra reaches 3500–3400Å.

A non-cyanide method of electropolishing silver

1978 ◽  
Vol 36 (1) ◽  
pp. 146-147
Author(s):  
R. L. Lyles ◽  
S. J. Rothman ◽  
W. Jäger
Keyword(s):  
Electron Microscopy ◽  
Sulphuric Acid ◽  
Methyl Alcohol ◽  
Health Hazards ◽  
Silver Alloy ◽  
High Quality ◽  
Silver Alloys ◽  
Free Sample ◽  
Specimen Quality ◽  
Standard Techniques

Standard techniques of electropolishing silver and silver alloys for electron microscopy in most instances have relied on various CN recipes. These methods have been characteristically unsatisfactory due to difficulties in obtaining large electron transparent areas, reproducible results, adequate solution lifetimes, and contamination free sample surfaces. In addition, there are the inherent health hazards associated with the use of CN solutions. Various attempts to develop noncyanic methods of electropolishing specimens for electron microscopy have not been successful in that the specimen quality problems encountered with the CN solutions have also existed in the previously proposed non-cyanic methods.The technique we describe allows us to jet polish high quality silver and silver alloy microscope specimens with consistant reproducibility and without the use of CN salts.The solution is similar to that suggested by Myschoyaev et al. It consists, in order of mixing, 115ml glacial actic acid (CH3CO2H, specific wt 1.04 g/ml), 43ml sulphuric acid (H2SO4, specific wt. g/ml), 350 ml anhydrous methyl alcohol, and 77 g thiourea (NH2CSNH2).

A High Resolution Scanning Microscope

1968 ◽  
Vol 26 ◽  
pp. 356-357
Author(s):  
A. V. Crewe ◽  
J. Wall ◽  
L. M. Welter
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Spherical Aberration ◽  
Focal Length ◽  
Spot Size ◽  
Emission Source ◽  
Field Of View ◽  
Scanning Microscope ◽  
Magnetic Lens ◽  
High Quality

A scanning microscope using a field emission source has been described elsewhere. This microscope has now been improved by replacing the single magnetic lens with a high quality lens of the type described by Ruska. This lens has a focal length of 1 mm and a spherical aberration coefficient of 0.5 mm. The final spot size, and therefore the microscope resolution, is limited by the aberration of this lens to about 6 Å.The lens has been constructed very carefully, maintaining a tolerance of + 1 μ on all critical surfaces. The gun is prealigned on the lens to form a compact unit. The only mechanical adjustments are those which control the specimen and the tip positions. The microscope can be used in two modes. With the lens off and the gun focused on the specimen, the resolution is 250 Å over an undistorted field of view of 2 mm. With the lens on,the resolution is 20 Å or better over a field of view of 40 microns. The magnification can be accurately varied by attenuating the raster current.

Quantitative defect studies in semiconductor TEM samples prepared by low angle ion milling

1995 ◽  
Vol 53 ◽  
pp. 512-513
Author(s):  
L. Mulestagno ◽  
J.C. Holzer ◽  
P. Fraundorf
Keyword(s):  
Sample Preparation ◽  
Milling Time ◽  
High Density ◽  
Low Density ◽  
Ion Milling ◽  
High Quality ◽  
Variable Angle ◽  
Major Disadvantage ◽  
Induced Defects

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).

Sign in / Sign up

Export Citation Format

Share Document