Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy
2020 ◽
Vol 69
(11)
◽
pp. 8874-8880
2013 ◽
Vol 718-720
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pp. 1446-1450
1998 ◽
Vol 37
(03)
◽
pp. 235-238
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1996 ◽