Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems

Aihua Wu; Xingchang Fu; Chen Liu; Chong Li; Yibang Wang; Faguo Liang; Peng Luan

doi:10.1109/tim.2019.2929671

Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2019.2929671 ◽

2020 ◽

Vol 69 (6) ◽

pp. 2837-2844 ◽

Cited By ~ 1

Author(s):

Aihua Wu ◽

Xingchang Fu ◽

Chen Liu ◽

Chong Li ◽

Yibang Wang ◽

...

Keyword(s):

Optimal Design ◽

Parameter Measurement ◽

Noise Parameter ◽

Measurement Systems ◽

Passive Devices

Download Full-text

Noise temperature of an electronic tuner for noise parameter measurement systems

79th ARFTG Microwave Measurement Conference ◽

10.1109/arftg79.2012.6291197 ◽

2012 ◽

Author(s):

Olle Axelsson ◽

Mattias Thorsell ◽

Kristoffer Andersson ◽

Jorgen Stenarson ◽

Yves Rolain

Keyword(s):

Noise Temperature ◽

Parameter Measurement ◽

Noise Parameter ◽

Measurement Systems

Download Full-text

Optimal design of measurement systems for current distribution measurement in parallel cables

COMPEL The International Journal for Computation and Mathematics in Electrical and Electronic Engineering ◽

10.1108/03321640910969449 ◽

2009 ◽

Vol 28 (5) ◽

pp. 1191-1201 ◽

Cited By ~ 3

Author(s):

I.M.V. Caminiti ◽

A. Formisano ◽

M.C. Lupoli ◽

R. Martone

Keyword(s):

Optimal Design ◽

Current Distribution ◽

Distribution Measurement ◽

Measurement Systems

Download Full-text

Experimental Investigation of On-Wafer Noise Parameter Measurement Accuracy

19th ARFTG Conference Digest ◽

10.1109/arftg.1996.327156 ◽

1996 ◽

Cited By ~ 1

Author(s):

Ali Boudiaf ◽

Andre Scavennec

Keyword(s):

Experimental Investigation ◽

Measurement Accuracy ◽

Parameter Measurement ◽

Noise Parameter

Download Full-text

Impossibility of Linear Two-Port Noise-Parameter Measurement with a Single Temperature Noise Source

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.1983.4315103 ◽

1983 ◽

Vol 32 (3) ◽

pp. 443-445 ◽

Cited By ~ 5

Author(s):

Madhu Sudan Gupta

Keyword(s):

Noise Source ◽

Parameter Measurement ◽

Noise Parameter ◽

Single Temperature ◽

Temperature Noise

Download Full-text

Two Noise Parameter Measurement Methods Using Spectrum Analyzer and Comparison

The Journal of Korean Institute of Electromagnetic Engineering and Science ◽

10.5515/kjkiees.2015.26.12.1072 ◽

2015 ◽

Vol 26 (12) ◽

pp. 1072-1082 ◽

Cited By ~ 3

Author(s):

Dong-Hyun Lee ◽

Kyung-Whan Yeom

Keyword(s):

Measurement Methods ◽

Spectrum Analyzer ◽

Parameter Measurement ◽

Noise Parameter

Download Full-text

Design of Wide-Band 6-Port Network for Noise Parameter Measurement Using 3-Section Wilkinson Power Divider and Slot-Coupled Directional Coupler

The Journal of Korean Institute of Electromagnetic Engineering and Science ◽

10.5515/kjkiees.2017.28.2.85 ◽

2017 ◽

Vol 28 (2) ◽

pp. 85-96

Author(s):

Dong-Hyun Lee ◽

Chang-Dae Lee ◽

Chan-Woo Lee ◽

Kyung-Whan Yeom

Keyword(s):

Directional Coupler ◽

Wide Band ◽

Parameter Measurement ◽

Power Divider ◽

Noise Parameter ◽

Wilkinson Power Divider

Download Full-text

On Impedance-Pattern Selection for Noise Parameter Measurement

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2015.2504500 ◽

2016 ◽

Vol 64 (1) ◽

pp. 258-270 ◽

Cited By ~ 15

Author(s):

Michael Himmelfarb ◽

Leonid Belostotski

Keyword(s):

Parameter Measurement ◽

Pattern Selection ◽

Noise Parameter ◽

Selection For

Download Full-text

A computer controlled noise parameter measurement system

1991 IEEE MTT-S International Microwave Symposium Digest ◽

10.1109/mwsym.1991.147188 ◽

2002 ◽

Cited By ~ 1

Author(s):

B. Albinsson ◽

H. Guo ◽

M. Schoon ◽

H.-O. Vickes

Keyword(s):

Measurement System ◽

Parameter Measurement ◽

Noise Parameter ◽

Computer Controlled

Download Full-text

Cryogenic Self-Calibrating Noise Parameter Measurement System

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2012.2188813 ◽

2012 ◽

Vol 60 (5) ◽

pp. 1456-1467 ◽

Cited By ~ 2

Author(s):

Damon Russell ◽

Sander Weinreb

Keyword(s):

Measurement System ◽

Parameter Measurement ◽

Noise Parameter

Download Full-text

Broadband Multi-State Electronic Impedance Tuner for On-Wafer Noise Parameter Measurement

10.1109/euma.2002.339219 ◽

2002 ◽

Cited By ~ 2

Author(s):

D. Pienkowski ◽

W. Wiatr

Keyword(s):

Parameter Measurement ◽

Noise Parameter

Download Full-text