A Low-Cost Fault-Tolerant Real, Reactive, and Apparent Power Measurement Technique Using Microprocessor

2007 ◽  
Vol 56 (6) ◽  
pp. 2672-2680 ◽  
Author(s):  
Arghya Sarkar ◽  
Samarjit Sengupta
Keyword(s):  
Measurement Technique ◽  
Fault Tolerant ◽  
Low Cost ◽  
Power Measurement

scholarly journals Lifetime of electrochromic optical transition cycling of ethyl viologen diperchlorate-based electrochromic devices

2021 ◽  
Vol 3 (5) ◽  
Author(s):  
Logan G. Kiefer ◽  
Christian J. Robert ◽  
Taylor D. Sparks
Keyword(s):  
Optical Transition ◽  
Low Cost ◽  
Cycling Performance ◽  
Power Measurement ◽  
Electrochromic Devices ◽  
Metal Oxide Films ◽  
Cycle Times ◽  
Vis Spectroscopy ◽  
Multiple Devices ◽  
Measurement Devices

AbstractElectrochromic materials and devices are enabling a variety of advanced technologies. Gel-based organic electrochromic molecules such as ethyl viologen diperchlorate are attractive options due to their simple device design and low cost processing options relative to the more expensive and complex transition metal oxide films. However, electrochromic devices are subject to extensive cycling in which failure and fatigue can eventually occur. This work presents the lifetime cycling performance of ethyl viologen diperchlorate-based electrochromic devices using two different anodic compounds, hydroquinone and ferrocene, which are cycled at different voltages, 3 V and 1.2 V, respectively. Multiple devices are cycled until failure with periodic device characterization via UV–Vis spectroscopy, electrical resistance and power measurement, and transition duration measurement. Devices with hydroquinone can transition quickly. Cycle times are $$\sim$$ ∼ 30 s in these samples, however, these samples also typically fail before 3000 cycles. On the other hand, devices using ferrocene transition more slowly (total cycle time $$\sim$$ ∼ 2 min), but have superior cycling performance with all samples surviving beyond 10,000 cycles while complying with ASTM E2141-14 standard.

scholarly journals Preparation of InSe Thin Films by Thermal Evaporation Method and Their Characterization: Structural, Optical, and Thermoelectrical Properties

2018 ◽  
Vol 2018 ◽  
pp. 1-9 ◽  
Author(s):  
Sarita Boolchandani ◽  
Subodh Srivastava ◽  
Y. K. Vijay
Keyword(s):  
Thin Films ◽  
Seebeck Coefficient ◽  
Thermoelectric Power ◽  
Temperature Variation ◽  
Thermal Evaporation ◽  
Low Cost ◽  
High Vacuum ◽  
Power Measurement ◽  
Thermal Evaporation Method ◽  
Evaporation Method

The indium selenium (InSe) bilayer thin films of various thickness ratios, InxSe(1-x) (x = 0.25, 0.50, 0.75), were deposited on a glass substrate keeping overall the same thickness of 2500 Ǻ using thermal evaporation method under high vacuum atmosphere. Electrical, optical, and structural properties of these bilayer thin films have been compared before and after thermal annealing at different temperatures. The structural and morphological characterization was done using XRD and SEM, respectively. The optical bandgap of these thin films has been calculated by Tauc’s relation that varies within the range of 1.99 to 2.05 eV. A simple low-cost thermoelectrical power measurement setup is designed which can measure the Seebeck coefficient “S” in the vacuum with temperature variation. The setup temperature variation is up to 70°C. This setup contains a Peltier device TEC1-12715 which is kept between two copper plates that act as a reference metal. Also, in the present work, the thermoelectric power of indium selenide (InSe) and aluminum selenide (AlSe) bilayer thin films prepared and annealed in the same way is calculated. The thermoelectric power has been measured by estimating the Seebeck coefficient for InSe and AlSe bilayer thin films. It was observed that the Seebeck coefficient is negative for InSe and AlSe thin films.

scholarly journals SOFTWARE IMPLEMENTED HARDWARE-TRANSIENT FAULTS DETECTION

2014 ◽  
pp. 26-30
Author(s):  
Goutam Kumar Saha
Keyword(s):  
Error Correction ◽  
Fault Tolerant ◽  
Low Cost ◽  
Transient Faults ◽  
Fault Tolerant System ◽  
Cost Approach ◽  
Run Time ◽  
Commodity Systems ◽  
Fail Safe ◽  
Register Error

This paper examines a software implemented self-checking technique that is capable of detecting processorregisters' hardware-transient faults. The proposed approach is intended to detect run-time transient bit-errors in memory and processor status register. Error correction is not considered here. However, this low-cost approach is intended to be adopted in commodity systems that use ordinary off-the-shelf microprocessors, for the purpose of operational faults detection towards gaining fail-safe kind of fault tolerant system.

scholarly journals An Efficient Hardware-Based Fault-Tolerant Method for SMS4

2018 ◽  
Vol 208 ◽  
pp. 02005
Author(s):  
Hanguang Luo ◽  
Guangjun Wen ◽  
Jian Su
Keyword(s):  
Error Detection ◽  
Wireless Lan ◽  
Fault Tolerant ◽  
Low Cost ◽  
Primary Objective ◽  
Data Confidentiality ◽  
Detection Scheme ◽  
Detection Delay ◽  
Encryption Decryption ◽  
Online Error Detection

The SMS4 cryptosystem has been used in the Wireless LAN Authentication and Privacy Infrastructure (WAPI) standard for providing data confidentiality in China. So far, reliability has not been considered a primary objective in original version. However, a single fault in the encryption/decryption process can completely change the result of the cryptosystem no matter the natural or malicious injected faults. In this paper, we proposed low-cost structure-independent fault detection scheme for SMS4 cryptosystem which is capable of performing online error detection and can detect a single bit fault or odd multiple bit faults in coverage of 100 percent. Finally, the proposed techniques have been validated on Virtex-7 families FPGA platform to analyze its power consumption, overhead and time delay. It only needs 85 occupied Slices and 8.72mW to run a fault-tolerant scheme of SMS4 cryptosystem with 0.735ns of detection delay. Our new scheme increases in minimum redundancy to enhance cryptosystem’s reliability and achieve a better performance compared with the previous scheme.

scholarly journals Energy Efficiency Due to a Common Global Timebase—Synchronizing FlexRay to 802.1AS Networks as a Foundation

2018 ◽  
Vol 8 (3) ◽  
pp. 26
Author(s):  
Paul Milbredt ◽  
Efim Schick ◽  
Michael Hübner
Keyword(s):  
Time Synchronization ◽  
Fault Tolerant ◽  
Low Cost ◽  
Autonomous Driving ◽  
Consumer Electronics ◽  
Area Network ◽  
Control Applications ◽  
Synchronization Mechanism ◽  
Global Clock ◽  
Time And Energy

Modern automotive control applications require a holistic time-sensitive development. Nowadays, this is achieved by technologies specifically designed for the automotive domain, like FlexRay, which offer a fault-tolerant time synchronization mechanism built into the protocol. Currently, the automotive industry adopts the Ethernet within the car, not only for embedding consumer electronics, but also as a fast and reliable backbone for control applications. Still, low-cost but highly reliable sensors connected over the traditional Controller Area Network (CAN) deliver data needed for autonomous driving. To fusion the data efficiently among all, a common timebase is required. The alternative would be oversampling, which uses more time and energy, e.g., at least double the perception rates of sensors. Ethernet and CAN do require the latter by default. Hence, a global synchronization mechanism eases tremendously the design of a low power automotive network and is the foundation of a transparent global clock. In this article, we present the first step: Synchronizing legacy FlexRay networks to the upcoming Ethernet backbone, which will contain a precise clock over the generalized Precision Time Protocol (gPTP) defined in IEEE 802.1AS. FlexRay then could still drive its strengths with deterministic transmission behavior and possibly also serve as a redundant technology for fail-operational system design.

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