Disbond Thickness Evaluation Employing Multiple-Frequency Near-Field Microwave Measurements

2007 ◽  
Vol 56 (4) ◽  
pp. 1107-1113 ◽  
Author(s):  
Mohamed Abou-Khousa ◽  
R. Zoughi
Keyword(s):  
Near Field ◽  
Microwave Measurements ◽  
Multiple Frequency ◽  
Thickness Evaluation

scholarly journals Direct and Inverse Scattering Problems for Domains with Multiple Corners

2015 ◽  
Vol 2015 ◽  
pp. 1-9 ◽  
Author(s):  
Songming Hou ◽  
Yihong Jiang ◽  
Yuan Cheng
Keyword(s):  
Inverse Scattering ◽  
Logarithmic Singularity ◽  
Near Field ◽  
Imaging Method ◽  
Far Field ◽  
Corner Singularity ◽  
Frequency Data ◽  
Multiple Frequency ◽  
Scattering Problems ◽  
Inverse Scattering Problems

We proposed numerical methods for solving the direct and inverse scattering problems for domains with multiple corners. Both the near field and far field cases are considered. For the forward problem, the challenges of logarithmic singularity from Green’s functions and corner singularity are both taken care of. For the inverse problem, an efficient and robust direct imaging method is proposed. Multiple frequency data are combined to capture details while not losing robustness.

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Principles of Planar Near-Field Antenna Measurements

2007 ◽  
Author(s):  
Stuart Gregson ◽  
John McCormick ◽  
Clive Parini
Keyword(s):  
Near Field ◽  
Antenna Measurements
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