Novel Three-Dimensional Beam Tracking System for Stationary-Sample-Type Atomic Force Microscopy
2006 ◽
Vol 55
(5)
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pp. 1648-1654
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2000 ◽
Vol 71
(1)
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pp. 137-141
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2004 ◽
Vol 33
(2)
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pp. 251-258
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2017 ◽
Vol 84
◽
pp. 102-109
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2011 ◽
Vol 82
(2)
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pp. 023707
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2004 ◽
Vol 18
(4)
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pp. 587-596
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