Increasing the time constant of a thin film multijunction thermal converter for low frequency application

1991 ◽  
Vol 40 (2) ◽  
pp. 350-351 ◽  
Author(s):  
M. Klonz ◽  
T. Weimann
Keyword(s):  
Thin Film ◽  
Time Constant ◽  
Low Frequency ◽  
Thermal Converter

Improvements in the Low-Frequency Characteristic and Sensitivity of a Thin-Film Multijunction Thermal Converter in Vacuum

2015 ◽  
Vol 64 (6) ◽  
pp. 1570-1575 ◽  
Author(s):  
Yasutaka Amagai ◽  
Hiroyuki Fujiki ◽  
Koji Shimizume ◽  
Kaname Kishino ◽  
Shigeru Hidaka
Keyword(s):  
Thin Film ◽  
Frequency Characteristic ◽  
Low Frequency ◽  
Thermal Converter

Improved Stability of a Thin-Film Multijunction Thermal Converter

2012 ◽  
Vol 132 (11) ◽  
pp. 1011-1017 ◽  
Author(s):  
Yasutaka Amagai ◽  
Hiroyuki Fujiki ◽  
Koji Shimizume ◽  
Shigeru Hidaka
Keyword(s):  
Thin Film ◽  
Thermal Converter ◽  
Improved Stability

Low frequency noise in amorphous silicon thin film transistors with SiNx gate dielectric

2009 ◽  
Vol 105 (12) ◽  
pp. 124504 ◽  
Author(s):  
S. L. Rumyantsev ◽  
Sung Hun Jin ◽  
M. S. Shur ◽  
Mun-Soo Park
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Thin Film Transistors ◽  
Gate Dielectric ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Silicon Thin Film

Onset of size effects in lattice thermal conductivity and lifetime of low-frequency thermal phonons

2012 ◽  
Vol 1404 ◽  
Author(s):  
A.A. Maznev
Keyword(s):  
Thin Film ◽  
Thermal Conductivity ◽  
Size Effects ◽  
Lattice Thermal Conductivity ◽  
Low Frequency ◽  
Square Root ◽  
Relaxation Rates ◽  
Frequency Limit ◽  
Conductivity Of Thin Films ◽  
Closed Form Formula

ABSTRACTThe onset of size effects in phonon-mediated thermal transport along a thin film at temperatures comparable or greater than the Debye temperature is analyzed theoretically. Assuming a quadratic frequency dependence of phonon relaxation rates in the low-frequency limit, a simple closed-form formula for the reduction of the in-plane thermal conductivity of thin films is derived. The effect scales as the square root of the film thickness, which leads to the prediction of measurable size-effects even at “macroscopic” distances ~100 μm. However, this prediction needs to be corrected to account for the deviation from the ω−2 dependence of phonon lifetimes at sub-THz frequencies due to the transition from Landau-Rumer to Akhiezer mechanism of phonon dissipation.

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