Frequency scaled segmented (FSS) scan architecture for optimized scan-shift power and faster test application time

2017 IEEE International Test Conference (ITC) ◽

10.1109/test.2017.8242052 ◽

2017 ◽

Author(s):

W. Pradeep ◽

P. Narayanan ◽

R. Mittal ◽

N. Maheshwari ◽

N. Naresh

Keyword(s):

Application Time ◽

Test Application Time ◽

Test Application

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Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead

Journal of Electronic Testing ◽

10.1007/s10836-010-5183-6 ◽

2010 ◽

Vol 26 (6) ◽

pp. 679-688 ◽

Cited By ~ 8

Author(s):

Usha Sandeep Mehta ◽

Kankar S. Dasgupta ◽

Nirnjan M. Devashrayee

Keyword(s):

Data Compression ◽

Test Data ◽

Compression Test ◽

Huffman Coding ◽

Test Data Compression ◽

Application Time ◽

Test Application Time ◽

Area Overhead ◽

Test Application

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Test response reuse-based SoC core test compression and test scheduling for test application time minimization

Microelectronics Journal ◽

10.1016/j.mejo.2008.03.001 ◽

2008 ◽

Vol 39 (12) ◽

pp. 1704-1709

Author(s):

Jingbo Shao ◽

Guangsheng Ma ◽

Zhi Yang ◽

Ruixue Zhang

Keyword(s):

Test Scheduling ◽

Application Time ◽

Test Application Time ◽

Test Response ◽

Test Compression ◽

Test Application ◽

Time Minimization

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Multi-mode Toggle Random Access Scan to Minimize Test Application Time

Communications in Computer and Information Science - VLSI Design and Test ◽

10.1007/978-981-10-7470-7_21 ◽

2017 ◽

pp. 205-216

Author(s):

Anshu Goel ◽

Rohini Gulve

Keyword(s):

Random Access ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Multi Mode

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Reduced Test Application Time Based on Reachability Analysis

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.102 ◽

2005 ◽

Author(s):

Th. Haniotakis ◽

S. Tragoudas ◽

G. Pani

Keyword(s):

Reachability Analysis ◽

Application Time ◽

Test Application Time ◽

Test Application

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Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-Chip Test Data Compression/Decompression

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_35 ◽

2008 ◽

pp. 479-495

Author(s):

Paul Theo Gonciari ◽

Bashir M. Al-Hashimi ◽

Nicola Nicolici

Keyword(s):

Data Compression ◽

Test Data ◽

Compression Ratio ◽

System On Chip ◽

Test Data Compression ◽

Application Time ◽

Test Application Time ◽

Area Overhead ◽

Test Application ◽

On Chip

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RT level testability analysis to reduce test application time

EUROMICRO 97 Proceedings of the 23rd EUROMICRO Conference New Frontiers of Information Technology (Cat No 97TB100167) EURMIC-97 ◽

10.1109/eurmic.1997.617229 ◽

2002 ◽

Author(s):

Z. Kotasek ◽

F. Zboril

Keyword(s):

Application Time ◽

Test Application Time ◽

Testability Analysis ◽

Test Application

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Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time

IEICE Transactions on Information and Systems ◽

10.1587/transinf.e92.d.1462 ◽

2009 ◽

Vol E92-D (7) ◽

pp. 1462-1465 ◽

Cited By ~ 2

Author(s):

Yongjoon KIM ◽

Myung-Hoon YANG ◽

Jaeseok PARK ◽

Eunsei PARK ◽

Sungho KANG

Keyword(s):

Test Data ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Data Volume

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An improved algorithm for TAM optimization to reduce test application time in core based SoC

2015 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE) ◽

10.1109/wiecon-ece.2015.7443963 ◽

2015 ◽

Cited By ~ 1

Author(s):

Harikrishna Parmar ◽

Usha Mehta

Keyword(s):

Application Time ◽

Test Application Time ◽

Test Application ◽

Improved Algorithm

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Static test compaction for scan-based designs to reduce test application time

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741614 ◽

2002 ◽

Cited By ~ 37

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Application Time ◽

Static Test ◽

Test Compaction ◽

Test Application Time ◽

Test Application

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The leafs scan-chain for test application time and scan power reduction

2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012) ◽

10.1109/icecs.2012.6463646 ◽

2012 ◽

Cited By ~ 3

Author(s):

Maria Chalkia ◽

Yiorgos Tsiatouhas

Keyword(s):

Power Reduction ◽

Application Time ◽

Test Application Time ◽

Test Application ◽

Scan Chain

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