Known-good-die test methods for large, thin, high-power digital devices

2016 ◽  
Author(s):  
Dave Armstrong ◽  
Gary Maier
Keyword(s):  
High Power ◽  
Test Methods ◽  
Digital Devices ◽  
Known Good Die

Evaluation of Test Protocol for Eutectic Die Attach Using High Power LEDs

2011 ◽  
Vol 2011 (1) ◽  
pp. 000136-000141 ◽  
Author(s):  
Amanda Hartnett ◽  
Seth Homer ◽  
Donald Beck ◽  
Daniel Evans
Keyword(s):  
High Power ◽  
Coefficient Of Thermal Expansion ◽  
Test Methods ◽  
Test Protocol ◽  
High Brightness ◽  
Light Emitting ◽  
Power Semiconductor ◽  
Heat System ◽  
Die Attach ◽  
Manufactured Products

High-power semiconductor devices, such as high-brightness Light Emitting Diodes (LEDs), must be mounted using a robust adhesive material to handle the temperature fluctuations generated by the chip and the mechanical stresses due to the coefficient of thermal expansion (CTE) mismatches between the die material and substrate it is mounted to. The selected material must also comply with current legislation restricting manufactured products containing numerous materials including some that were historically popular in HB LED applications due to environmental concerns. Eutectic gold-tin (AuSn) materials meet these requirements, and process recommendations for their implementation will be presented in this paper. Utilizing a Palomar Technologies die bonder, AuSn solder preforms and paste will be placed/dispensed and reflowed using a Pulsed Heat System (PHS). Evaluation methods comparing these means of eutectic die attach to a pre-plated AuSn die will be discussed. Technical generalizations will be detailed to explain the derivation of test methods as well as hypotheses of results.

scholarly journals Testing digital instruments and power systems devices

2020 ◽  
Vol 216 ◽  
pp. 01063
Author(s):  
Pavel Pavlov ◽  
Vladimir Fandeev ◽  
Valery Butakov ◽  
Dilyara Baymeeva ◽  
Venera Safiullina
Keyword(s):  
Power Systems ◽  
Reference Point ◽  
Test Methods ◽  
The Other ◽  
Electric Signal ◽  
State Monitoring ◽  
Digital Device ◽  
Digital Devices ◽  
Healthy State ◽  
And Control

Discussed here is a technique for testing digital devices based on the calculation and control of two or more characteristics of a binary electric signal at a reference point. Signals coming from a healthy and failed digital device that are indistinguishable by the value of one of the characteristics may differ in value of the other characteristic. The combination of test methods can significantly reduce the potential of not detecting the failure of digital device. The technique is aimed at increasing the information content of the healthy state monitoring results and the possibility of localizing failures in digital instruments and devices of power systems.

scholarly journals Accelerated Test Methods for Life Estimation of High-Power Lithium-Ion Batteries

2010 ◽  
Vol 78 (5) ◽  
pp. 384-386 ◽  
Author(s):  
Yuichi MITA ◽  
Shiro SEKI ◽  
Nobuyuki TERADA ◽  
Nobuo KIHIRA ◽  
Katsuhito TAKEI ◽  
...  
Keyword(s):  
Lithium Ion Batteries ◽  
High Power ◽  
Lithium Ion ◽  
Test Methods ◽  
Accelerated Test ◽  
Life Estimation

scholarly journals Femtosecond Laser-Induced Damage Characterization of Multilayer Dielectric Coatings

Coatings ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 603 ◽  
Author(s):  
Praveen Kumar Velpula ◽  
Daniel Kramer ◽  
Bedrich Rus
Keyword(s):  
Femtosecond Laser ◽  
High Power ◽  
Damage Threshold ◽  
Test Methods ◽  
Optical Components ◽  
Damage Mechanisms ◽  
Coating Failure ◽  
Raster Scan ◽  
Laser Systems ◽  
Laser Induced Damage

The laser-induced damage threshold (LIDT) of optical components is one of the major constraints in developing high-power ultrafast laser systems. Multi-layer dielectric (MLD) coatings-based optical components are key parts of high-power laser systems because of their high damage resistance. Therefore, understanding and characterizing the laser-induced damage of MLD coatings are of paramount importance for developing ultrahigh-intensity laser systems. In this article, we overview the possible femtosecond laser damage mechanisms through damage morphologies in various MLD optical coatings tested in our facility. To evaluate the major contributions to the coating failure, different LIDT test methods (R-on-1, ISO S-on-1 and Raster Scan) were carried out for a high reflective hybrid Ta2O5/HfO2/SiO2 MLD mirror coating at a pulse duration of 37 fs. Different LIDT test methods were compared due to the fact that each test method exposes the different underlying damage mechanisms. For instance, the ISO S-on-1 test at a higher number of laser pulses can bring out the fatigue effects, whereas the Raster Scan method can reveal the non-uniform defect clusters in the optical coating. The measured LIDT values on the sample surface for the tested coating in three test methods are 1.1 J/cm2 (R-on-1), 0.9 J/cm2 (100k-on-1) and 0.6 J/cm2 (Raster Scan) at an angle of incidence of 45 deg. The presented results reveal that the performance of the tested sample is limited by coating defects rather than fatigue effects. Hence, the Raster Scan method is found to be most accurate for the tested coating in evaluating the damage threshold for practical applications. Importantly, this study demonstrates that the testing of different LIDT test protocols is necessary in femtosecond regime to assess the key mechanisms to the coating failure.

Laboratory proficiency in susceptibility testing of Helicobacter pylori using agar dilution and E test methods

2001 ◽  
Vol 120 (5) ◽  
pp. A586-A587
Author(s):  
L BEST ◽  
S JO ◽  
V VANZANTEN ◽  
D HALDANE ◽  
V LOO ◽  
...  
Keyword(s):  
Helicobacter Pylori ◽  
Susceptibility Testing ◽  
Test Methods ◽  
Agar Dilution

Dynamic Modeling and Wear-Based Remaining Useful Life Prediction of High Power Clutch Systems

2005 ◽  
Vol 48 (2) ◽  
pp. 208-217 ◽  
Author(s):  
Matthew Watson ◽  
Carl Byington ◽  
Douglas Edwards ◽  
Sanket Amin
Keyword(s):  
Dynamic Modeling ◽  
High Power ◽  
Life Prediction ◽  
Remaining Useful Life ◽  
Useful Life

Less Power, Greater Conflict

2018 ◽  
Vol 49 (1) ◽  
pp. 47-62 ◽  
Author(s):  
Petra C. Schmid
Keyword(s):  
Low Power ◽  
High Power ◽  
Goal Pursuit ◽  
Goal Conflict ◽  
Personal Goals ◽  
Multiple Goals ◽  
Objective Performance ◽  
The Future ◽  
The Way

Abstract. Power facilitates goal pursuit, but how does power affect the way people respond to conflict between their multiple goals? Our results showed that higher trait power was associated with reduced experience of conflict in scenarios describing multiple goals (Study 1) and between personal goals (Study 2). Moreover, manipulated low power increased individuals’ experience of goal conflict relative to high power and a control condition (Studies 3 and 4), with the consequence that they planned to invest less into the pursuit of their goals in the future. With its focus on multiple goals and individuals’ experiences during goal pursuit rather than objective performance, the present research uses new angles to examine power effects on goal pursuit.

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