Developing a modern platform for test engineering — Introducing the origen semiconductor developer's kit

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342393 ◽

2015 ◽

Cited By ~ 2

Author(s):

Stephen McGinty ◽

Daniel Hadad ◽

Chris Nappi ◽

Brian Caquelin

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