Analog Test Technology: Challenges Abound

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700664 ◽

2008 ◽

Author(s):

T.J. Anderson

Keyword(s):

Analog Test ◽

Test Technology

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Analog Test Technology: Stable and Grounded, or Open Loop and Spurious

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700663 ◽

2008 ◽

Cited By ~ 1

Author(s):

S. Goyal

Keyword(s):

Open Loop ◽

Analog Test ◽

Test Technology

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Analog Test Technology: Stable and Grounded, or Open Loop and Spurious?

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700662 ◽

2008 ◽

Author(s):

M. Purtell

Keyword(s):

Open Loop ◽

Analog Test ◽

Test Technology

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Public Interest: Agency sounds alarm on work test technology

PsycEXTRA Dataset ◽

10.1037/e382052004-026 ◽

1987 ◽

Author(s):

John Bales

Keyword(s):

Public Interest ◽

Test Technology

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Power performance test technology of electric vehicle based on test standard

Study on Dynamical System ◽

10.35534/sds.0102007c ◽

2019 ◽

Vol 1 (2) ◽

pp. 52-57

Author(s):

Pan Haohao

Keyword(s):

Electric Vehicle ◽

Performance Test ◽

Power Performance ◽

Test Technology

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The Operating Environment Substitution-based Field Test Technology of UHVDC Protection System: Part 2 Software Environment Substitution and Field Application

8th Renewable Power Generation Conference (RPG 2019) ◽

10.1049/cp.2019.0305 ◽

2019 ◽

Author(s):

Xiangping Kong ◽

Xinyue Gong ◽

Zhihai Shu ◽

Chenqing Wang

Keyword(s):

Field Test ◽

Field Application ◽

Protection System ◽

Operating Environment ◽

Software Environment ◽

Test Technology ◽

System Part

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Research on Strength Test Technology and Fatigue Evaluation Method of Bogie Frame and Body Bolster

Journal of Physics Conference Series ◽

10.1088/1742-6596/1972/1/012038 ◽

2021 ◽

Vol 1972 (1) ◽

pp. 012038

Author(s):

Cao Yu ◽

Lu Chong ◽

Li Zihua ◽

Song Jie ◽

Ding Xiebin

Keyword(s):

Evaluation Method ◽

Strength Test ◽

Bogie Frame ◽

Test Technology ◽

Fatigue Evaluation

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Test Technology Newsletter

Journal of Electronic Testing ◽

10.1007/s10836-011-5198-7 ◽

2011 ◽

Vol 27 (1) ◽

pp. 7-8

Keyword(s):

Test Technology

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Test Technology TC Newsletter

IEEE Design & Test of Computers ◽

10.1109/mdt.2011.65 ◽

2011 ◽

Vol 28 (3) ◽

pp. 92-93

Keyword(s):

Test Technology

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A hierarchical analog test bus framework for testing mixed-signal integrated circuits and printed circuit boards

Analog Integrated Circuits and Signal Processing ◽

10.1007/bf01239078 ◽

1993 ◽

Vol 4 (3) ◽

pp. 261-268 ◽

Cited By ~ 1

Author(s):

Nai-Chi Lee

Keyword(s):

Integrated Circuits ◽

Printed Circuit Boards ◽

Circuit Boards ◽

Analog Test ◽

Mixed Signal ◽

Printed Circuit

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Test technology on CCD anti-sunlight jamming based on complex circumstance

10.1117/12.2243445 ◽

2016 ◽

Author(s):

Sheng-bing Shi ◽

Zhen-xing Chen ◽

Fu-li Han

Keyword(s):

Test Technology

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