Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700612 ◽

2008 ◽

Cited By ~ 8

Author(s):

B. Moore ◽

M. Mangrum ◽

C. Sellathamby ◽

M. Reja ◽

T. Weng ◽

...

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