Panel 7 : cost of test - taking control [failure mechanism]

Author(s):  
N. Mukherjee
2018 ◽  
Author(s):  
Mahdi Mahmoudi ◽  
Morteza Roostaei ◽  
Vahidoddin Fattahpour ◽  
Colby Sutton ◽  
Brent Fermaniuk ◽  
...  

Author(s):  
Jin Young Kim ◽  
R. E. Hummel ◽  
R. T. DeHoff

Gold thin film metallizations in microelectronic circuits have a distinct advantage over those consisting of aluminum because they are less susceptible to electromigration. When electromigration is no longer the principal failure mechanism, other failure mechanisms caused by d.c. stressing might become important. In gold thin-film metallizations, grain boundary grooving is the principal failure mechanism.Previous studies have shown that grain boundary grooving in gold films can be prevented by an indium underlay between the substrate and gold. The beneficial effect of the In/Au composite film is mainly due to roughening of the surface of the gold films, redistribution of indium on the gold films and formation of In2O3 on the free surface and along the grain boundaries of the gold films during air annealing.


2010 ◽  
Vol 9 (3) ◽  
pp. 117-125 ◽  
Author(s):  
Thomas A. O’Neill ◽  
Richard D. Goffin ◽  
Ian R. Gellatly

In this study we assessed whether the predictive validity of personality scores is stronger when respondent test-taking motivation (TTM) is higher rather than lower. Results from a field sample comprising 269 employees provided evidence for this moderation effect for one trait, Steadfastness. However, for Conscientiousness, valid criterion prediction was only obtained at low levels of TTM. Thus, it appears that TTM relates to the criterion validity of personality testing differently depending on the personality trait assessed. Overall, these and additional findings regarding the nomological net of TTM suggest that it is a unique construct that may have significant implications when personality assessment is used in personnel selection.


2011 ◽  
Author(s):  
Rachel C. Johnson ◽  
Gregory P. Leffler ◽  
Richard N. Landers
Keyword(s):  

2009 ◽  
Author(s):  
Michael P. Brooks ◽  
Edward A. Martinelli ◽  
Spencer Clayton ◽  
Julie Preece ◽  
Mark E. Beecher ◽  
...  
Keyword(s):  

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