Plug & play I/sub DDQ/ monitoring with QTAG

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529905 ◽

2002 ◽

Cited By ~ 1

Author(s):

K. Baker ◽

T.F. Waayers ◽

F.G.M. Bouwman ◽

M.J.W. Verstraelen

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