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Plug & play I/sub DDQ/ monitoring with QTAG
Proceedings of 1995 IEEE International Test Conference (ITC)
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10.1109/test.1995.529905
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2002
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Cited By ~ 1
Author(s):
K. Baker
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T.F. Waayers
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F.G.M. Bouwman
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M.J.W. Verstraelen
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