An interactive sequential test pattern generation system

Mapping Intimacies ◽

10.1109/test.1989.82275 ◽

2003 ◽

Cited By ~ 3

Author(s):

R. Razdan ◽

M. Anwaruddin ◽

P.G. Kovijanic ◽

R. Ganesh ◽

H.-C. Shih

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Sequential Test ◽

Test Pattern Generation ◽

Generation System

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A distributed automatic test pattern generation system

High-Performance Computing and Networking - Lecture Notes in Computer Science ◽

10.1007/bfb0020356 ◽

2005 ◽

pp. 105-110 ◽

Cited By ~ 1

Author(s):

Peter A. Krauss

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

Automatic Test

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DYNAMITE: an efficient automatic test pattern generation system for path delay faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.88928 ◽

1991 ◽

Vol 10 (10) ◽

pp. 1323-1335 ◽

Cited By ~ 126

Author(s):

K. Fuchs ◽

F. Fink ◽

M.H. Schulz

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Generation System ◽

Automatic Test

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PLABEK: a complete automatic test pattern generation system for break faults in programmable logic arrays

1995 International Symposium on VLSI Technology Systems and Applications Proceedings of Technical Papers VTSA-95 ◽

10.1109/vtsa.1995.524639 ◽

2002 ◽

Author(s):

Gwo-Haur Hwang ◽

Wen-Zen Shen ◽

Shing Tenqchen

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Programmable Logic ◽

Generation System ◽

Programmable Logic Arrays ◽

Automatic Test

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A new test pattern generation system

19th Design Automation Conference ◽

10.1145/800139.804513 ◽

1980 ◽

Author(s):

Yacoub M. El-ziq

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation System

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SOCRATES: a highly efficient automatic test pattern generation system

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.3140 ◽

1988 ◽

Vol 7 (1) ◽

pp. 126-137 ◽

Cited By ~ 383

Author(s):

M.H. Schulz ◽

E. Trischler ◽

T.M. Sarfert

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

Automatic Test ◽

Highly Efficient

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Test pattern generation system for delay faults using a high speed simulation processor 'SP'

Digest of Papers. 1992 IEEE VLSI Test Symposium ◽

10.1109/vtest.1992.232717 ◽

2003 ◽

Author(s):

Y. Izuta ◽

F. Hirose

Keyword(s):

High Speed ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Faults ◽

Generation System ◽

Speed Simulation

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Results of a topologically partitioned parallel automatic test pattern generation system on a distributed-memory multiprocessor

[1992] Proceedings. Fifth Annual IEEE International ASIC Conference and Exhibit ◽

10.1109/asic.1992.270264 ◽

2003 ◽

Cited By ~ 3

Author(s):

R.H. Bell ◽

R.H. Klenke ◽

J.H. Aylor ◽

R.D. Williams

Keyword(s):

Distributed Memory ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

Automatic Test

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Cellular automata for deterministic sequential test pattern generation

Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) ◽

10.1109/vtest.1997.599442 ◽

2002 ◽

Cited By ~ 11

Author(s):

S. Chiusano ◽

F. Corno ◽

P. Prinetto ◽

M. Sonza Reorda

Keyword(s):

Cellular Automata ◽

Test Pattern ◽

Pattern Generation ◽

Sequential Test ◽

Test Pattern Generation

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LDS-ATPG: an automatic test pattern generation system for combinational VLSI circuits

10.1109/vtsa.1989.68604 ◽

2003 ◽

Author(s):

Sen-Chung Jiang ◽

Chung Len Lee ◽

Wen-Zen Shen ◽

J.-E. Chen ◽

Ching-Ping Wu

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Vlsi Circuits ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

Automatic Test

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A hierarchical test pattern generation system based on high-level primitives

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.108617 ◽

1992 ◽

Vol 11 (1) ◽

pp. 34-44 ◽

Cited By ~ 7

Author(s):

T.M. Sarfert ◽

R.G. Markgraf ◽

M.H. Schulz ◽

E. Trischler

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation System ◽

High Level

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