Impact of Dummy Gate Removal and a Silicon Cap on the Low-Frequency Noise Performance of Germanium nFinFETs

2020 ◽  
Vol 67 (11) ◽  
pp. 4713-4719
Author(s):  
Duan Xie ◽  
Eddy Simoen ◽  
Haifeng Chen ◽  
Hiroaki Arimura ◽  
Naoto Horiguchi
2005 ◽  
Vol 152 (9) ◽  
pp. F115 ◽  
Author(s):  
C. Claeys ◽  
E. Simoen ◽  
A. Mercha ◽  
L. Pantisano ◽  
E. Young

2009 ◽  
Author(s):  
C. Claeys ◽  
A. Mercha ◽  
E. Simoen ◽  
Massimo Macucci ◽  
Giovanni Basso

2015 ◽  
Vol 30 (10) ◽  
pp. 105011 ◽  
Author(s):  
A P Craig ◽  
M D Thompson ◽  
Z-B Tian ◽  
S Krishna ◽  
A Krier ◽  
...  

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