A Study of Accelerated Life Test of White OLED Based on Maximum Likelihood Estimation Using Lognormal Distribution

2012 ◽  
Vol 59 (12) ◽  
pp. 3401-3404 ◽  
Author(s):  
Jianping Zhang ◽  
Fang Liu ◽  
Yu Liu ◽  
Helen Wu ◽  
Wenli Wu ◽  
...  
2011 ◽  
Vol 291-294 ◽  
pp. 2211-2214
Author(s):  
Yu Hong Xing ◽  
Rui Yuan Liu

This paper investigates the maximum likelihood estimation of the average lifespan of products with the constraints, and the estimation of the average lifespan at stress level, which follows the exponential distribution, is derived by transforming the time-censoring step-stress accelerated life test data into the corresponding constant-stress accelerated life test data. The proposed method can overcome the shortcoming of information lose.


1993 ◽  
Vol 120 (1) ◽  
pp. 171-183 ◽  
Author(s):  
R. J. Verrall ◽  
Z. Li

AbstractThis paper considers the application of loglinear models to claims run-off triangles which contain negative incremental claims. Maximum likelihood estimation is applied using the three parameter lognormal distribution. The method can be used in conjunction with any model which can be expressed in lognormal form. In particular the chain ladder technique is considered. An example is given and the results compared with the basic actuarial method.


2012 ◽  
Vol 59 (3) ◽  
pp. 715-720 ◽  
Author(s):  
JianPing Zhang ◽  
TingJun Zhou ◽  
Helen Wu ◽  
Yu Wu ◽  
WenLi Wu ◽  
...  

Author(s):  
Mashroor Ahmad Khan ◽  
Navin Chandra

 In this paper, a step-stress accelerated life test with two stress variables for Weibull distribution under progressive type-I censoring is considered. The stress-life relationship as a log-linear function of stress levels, and for each combination of stress levels, a cumulative exposure model is assumed. The maximum likelihood and Bayes estimates of the model parameters are obtained. The optimum test plan is developed using variance-optimality criterion, which consists in finding out the optimal stress change time by minimizing asymptotic variance of the maximum likelihood estimates of the log of the scale parameter at the design stress. The proposed study illustrated by using simulated data.


2012 ◽  
Vol 27 (1) ◽  
pp. 61-65
Author(s):  
张建平 ZHANG Jian-ping ◽  
刘宇 LIU Yu ◽  
成国梁 CHENG Guo-liang ◽  
朱文清 ZHU Wen-qing ◽  
刘芳 LIU Fang

2012 ◽  
Vol 41 (1) ◽  
pp. 20120183 ◽  
Author(s):  
Jian-ping Zhang ◽  
Jiong-lei Wu ◽  
Yu Liu ◽  
Helen Wu ◽  
Aixi Zhou ◽  
...  

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