Analysis of the Correlation Between the Programmed Threshold-Voltage Distribution Spread of nand Flash Memory Devices and Floating-Gate Impurity Concentration

2011 ◽  
Vol 58 (11) ◽  
pp. 3712-3719 ◽  
Author(s):  
Riichiro Shirota ◽  
Yoshinori Sakamoto ◽  
Hung-Ming Hsueh ◽  
Jian-Ming Jaw ◽  
Wen-Chuan Chao ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Flash Memory ◽  
Impurity Concentration ◽  
Floating Gate ◽  
Memory Devices ◽  
Nand Flash ◽  
Voltage Distribution ◽  
Nand Flash Memory ◽  
Threshold Voltage Distribution

Modeling of Threshold Voltage Distribution in 3D NAND Flash Memory

2021 ◽  
Author(s):  
Weihua Liu ◽  
Fei Wu ◽  
Jian Zhou ◽  
Meng Zhang ◽  
Chengmo Yang ◽  
...  
Keyword(s):  
Threshold Voltage ◽  
Flash Memory ◽  
Nand Flash ◽  
Voltage Distribution ◽  
Nand Flash Memory ◽  
Threshold Voltage Distribution
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