Uncertainty Analysis of Two-Step and Three-Step Methods for Deembedding On-Wafer RF Transistor Measurements

2008 ◽  
Vol 55 (8) ◽  
pp. 2195-2201 ◽  
Author(s):  
Junyoung Cha ◽  
Jiyong Cha ◽  
Seonghearn Lee
2014 ◽  
Author(s):  
M Bambang Ontowiryo ◽  
Akbar Kurniawan ◽  
Lalang Jati Sardinda ◽  
Suderajat Suderajat ◽  
Jati Priyantoro ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document