Experimental Investigation on the Quasi-Ballistic Transport: Part II—Backscattering Coefficient Extraction and Link With the Mobility

Vincent Barral; Thierry Poiroux; Daniela Munteanu; Jean-Luc Autran; Simon Deleonibus

doi:10.1109/ted.2008.2011682

Experimental Investigation on the Quasi-Ballistic Transport: Part II—Backscattering Coefficient Extraction and Link With the Mobility

IEEE Transactions on Electron Devices ◽

10.1109/ted.2008.2011682 ◽

2009 ◽

Vol 56 (3) ◽

pp. 420-430 ◽

Cited By ~ 31

Author(s):

Vincent Barral ◽

Thierry Poiroux ◽

Daniela Munteanu ◽

Jean-Luc Autran ◽

Simon Deleonibus

Keyword(s):

Experimental Investigation ◽

Ballistic Transport ◽

Backscattering Coefficient ◽

Transport Part

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Experimental Investigation on the Quasi-Ballistic Transport: Part I—Determination of a New Backscattering Coefficient Extraction Methodology

IEEE Transactions on Electron Devices ◽

10.1109/ted.2008.2011681 ◽

2009 ◽

Vol 56 (3) ◽

pp. 408-419 ◽

Cited By ~ 36

Author(s):

Vincent Barral ◽

Thierry Poiroux ◽

JÉrÔme Saint-Martin ◽

Daniela Munteanu ◽

Jean-Luc Autran ◽

...

Keyword(s):

Experimental Investigation ◽

Ballistic Transport ◽

Backscattering Coefficient ◽

Transport Part

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New Unified Analytical Model of Backscattering Coefficient From Low- to High-Field Conditions in Quasi-Ballistic Transport

IEEE Electron Device Letters ◽

10.1109/led.2008.2007305 ◽

2008 ◽

Vol 29 (12) ◽

pp. 1392-1394 ◽

Cited By ~ 6

Author(s):

SÉbastien Martinie ◽

Daniela Munteanu ◽

Gilles Le Carval ◽

Jean-Luc Autran

Keyword(s):

Analytical Model ◽

High Field ◽

Ballistic Transport ◽

Field Conditions ◽

Backscattering Coefficient

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A new method for the observation of Type II magnetic contrast

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100176952 ◽

1990 ◽

Vol 48 (4) ◽

pp. 764-765

Author(s):

R.P. Ferrier ◽

S. McVitie

Keyword(s):

Domain Walls ◽

Incident Beam ◽

Objective Lens ◽

Type Ii ◽

Backscattering Coefficient ◽

Magnetic Contrast ◽

Standard Geometry ◽

Backscattered Electron ◽

Imaging Performance ◽

Good Probe

Type II magnetic contrast was first observed by Philibert and Tixier and relies on the change in the effective backscattering coefficient due to interaction of the scattered electrons within the specimen and the local magnetic induction (for a review see Tsuno). Depending on the tilt of the specimen and the position of the backscattered electron detector(s), contrast due to the presence of either or both domains and domain walls can be obtained; in the case of the latter, the standard geometry is for the specimen to be normal to the incident beam and the detectors are positioned above it and close to the optic axis. This is the geometry adopted in our studies, which used a JEOL 2000FX with a special split objective lens polepiece; this permitted the specimen to be in magnetic field-free space, the separate lens gaps above and below allowing good probe forming capabilities combined with excellent Lorentz imaging performance. A schematic diagram is shown in Fig. 1.

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