Scaling Analysis of Multilevel Interconnect Temperatures for High-Performance ICs

2005 ◽  
Vol 52 (12) ◽  
pp. 2710-2719 ◽  
Author(s):  
S. Im ◽  
N. Srivastava ◽  
K. Banerjee ◽  
K.E. Goodson
Keyword(s):  
High Performance ◽  
Scaling Analysis

scholarly journals A High Performance Computing Approach to the Simulation of Fluid-Solid interaction Problems with Rigid and Flexible Components

2014 ◽  
Vol 61 (2) ◽  
pp. 227-251 ◽  
Author(s):  
Arman Pazouki ◽  
Radu Serban ◽  
Dan Negrut
Keyword(s):  
Boundary Condition ◽  
High Performance Computing ◽  
High Performance ◽  
Rigid Body Dynamics ◽  
Small Scale ◽  
Scaling Analysis ◽  
Force Model ◽  
Processing Unit ◽  
Performance Computing ◽  
Fluid Solid Interaction

Abstract This work outlines a unified multi-threaded, multi-scale High Performance Computing (HPC) approach for the direct numerical simulation of Fluid-Solid Interaction (FSI) problems. The simulation algorithm relies on the extended Smoothed Particle Hydrodynamics (XSPH) method, which approaches the fluid flow in a La-grangian framework consistent with the Lagrangian tracking of the solid phase. A general 3D rigid body dynamics and an Absolute Nodal Coordinate Formulation (ANCF) are implemented to model rigid and flexible multibody dynamics. The two-way coupling of the fluid and solid phases is supported through use of Boundary Condition Enforcing (BCE) markers that capture the fluid-solid coupling forces by enforcing a no-slip boundary condition. The solid-solid short range interaction, which has a crucial impact on the small-scale behavior of fluid-solid mixtures, is resolved via a lubrication force model. The collective system states are integrated in time using an explicit, multi-rate scheme. To alleviate the heavy computational load, the overall algorithm leverages parallel computing on Graphics Processing Unit (GPU) cards. Performance and scaling analysis are provided for simulations scenarios involving one or multiple phases with up to tens of thousands of solid objects. The software implementation of the approach, called Chrono:Fluid, is part of the Chrono project and available as an open-source software.

scholarly journals Strong Scaling Analysis of a Parallel, Unstructured, Implicit Solver and the Influence of the Operating System Interference

2009 ◽  
Vol 17 (3) ◽  
pp. 261-274 ◽  
Author(s):  
Onkar Sahni ◽  
Christopher D. Carothers ◽  
Mark S. Shephard ◽  
Kenneth E. Jansen
Keyword(s):  
Operating System ◽  
High Performance ◽  
Numerical Models ◽  
Scaling Analysis ◽  
Parallel Performance ◽  
Implicit Solvers ◽  
Strong Scaling ◽  
Implicit Solver ◽  
Supercomputer Systems ◽  
Computation Codes

PHASTA falls under the category of high-performance scientific computation codes designed for solving partial differential equations (PDEs). Its a massively parallel unstructured, implicit solver with particular emphasis on fluid dynamics (CFD) applications. More specifically, PHASTA is a parallel, hierarchic, adaptive, stabilized, transient analysis code that effectively employs advanced anisotropic adaptive algorithms and numerical models of flow physics. In this paper, we first describe the parallelization of PHASTA's core algorithms for an implicit solve, where one of our key assumptions is that on a properly balanced supercomputer with appropriate attributes, PHASTA should continue to strongly scale on high core counts until the computational workload per core becomes insufficient and inter-processor communications start to dominate. We then present and analyze PHASTA's parallel performance across a variety of current near petascale systems, including IBM BG/L, IBM BG/P, Cray XT3, and custom Opteron based supercluster; this selection of systems with inherently different attributes covers a majority of potential candidates for upcoming petascale systems. On one hand, we achieve near perfect (linear) strong scaling out to 32,768 cores of IBM BG/L; showing that a system with desirable attributes will allow implicit solvers to strongly scale on high core counts (including petascale systems). On the contrary, we find that the relative tipping point for strong scaling fundamentally differs among current supercomputer systems. To understand the loss of scaling observed on a particular system (Opteron based supercluster) we analyze the performance and demonstrate that such a loss can be associated to an unbalance in a system attribute; specifically compute-node operating system (OS). In particular, PHASTA scales well to high core counts (up to 32,768 cores) during an implicit solve on systems with compute nodes using lightweight kernels (for example, IBM BG/L); however, we show that on a system where the compute node OS is more heavy weight (e.g., one with background processes) a loss in strong scaling is observed relatively at much fewer number of cores (4,096 cores).

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

Use of the Magnetostatic Analogue In Electromagnetic Lens Engineering

1970 ◽  
Vol 28 ◽  
pp. 360-361
Author(s):  
John W. Coleman
Keyword(s):  
Boundary Conditions ◽  
High Performance ◽  
Force Fields ◽  
Optical Design ◽  
Direct Conversion ◽  
Design Engineering ◽  
Design Data ◽  
Scalar Potentials ◽  
Geometric Elements ◽  
At Will

In the design engineering of high performance electromagnetic lenses, the direct conversion of electron optical design data into drawings for reliable hardware is oftentimes difficult, especially in terms of how to mount parts to each other, how to tolerance dimensions, and how to specify finishes. An answer to this is in the use of magnetostatic analytics, corresponding to boundary conditions for the optical design. With such models, the magnetostatic force on a test pole along the axis may be examined, and in this way one may obtain priority listings for holding dimensions, relieving stresses, etc..The development of magnetostatic models most easily proceeds from the derivation of scalar potentials of separate geometric elements. These potentials can then be conbined at will because of the superposition characteristic of conservative force fields.

Prospects for convergent beam electron diffraction with a 200kV cold field-emission transmission electron microscope

1991 ◽  
Vol 49 ◽  
pp. 466-467
Author(s):  
J W Steeds ◽  
R Vincent
Keyword(s):  
Field Emission ◽  
High Performance ◽  
Small Diameter ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Medium Voltage ◽  
Transmission Electron ◽  
Good Crystallinity ◽  
Special Modification ◽  
Convergent Beam

We review the analytical powers which will become more widely available as medium voltage (200-300kV) TEMs with facilities for CBED on a nanometre scale come onto the market. Of course, high performance cold field emission STEMs have now been in operation for about twenty years, but it is only in relatively few laboratories that special modification has permitted the performance of CBED experiments. Most notable amongst these pioneering projects is the work in Arizona by Cowley and Spence and, more recently, that in Cambridge by Rodenburg and McMullan.There are a large number of potential advantages of a high intensity, small diameter, focussed probe. We discuss first the advantages for probes larger than the projected unit cell of the crystal under investigation. In this situation we are able to perform CBED on local regions of good crystallinity. Zone axis patterns often contain information which is very sensitive to thickness changes as small as 5nm. In conventional CBED, with a lOnm source, it is very likely that the information will be degraded by thickness averaging within the illuminated area.

Current State of Biological High-Resolution Scanning Electron Microscopy

1988 ◽  
Vol 46 ◽  
pp. 180-181 ◽  
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
High Performance ◽  
Low Voltage ◽  
Backscattered Electrons ◽  
Lens Position ◽  
Low Voltage Operation ◽  
Signal Collection ◽  
Probe Size ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).

A high-performance oil-free backing pump for electron microscopes

1978 ◽  
Vol 36 (1) ◽  
pp. 110-111
Author(s):  
G.K.W. Balkau ◽  
E. Bez ◽  
J.L. Farrant
Keyword(s):  
Molecular Weight ◽  
Electron Microscope ◽  
Hot Spots ◽  
High Performance ◽  
Carbonaceous Material ◽  
Contamination Rate ◽  
Low Molecular Weight ◽  
Principal Source ◽  
Rotary Pumps ◽  
Electron Microscopes

The earliest account of the contamination of electron microscope specimens by the deposition of carbonaceous material during electron irradiation was published in 1947 by Watson who was then working in Canada. It was soon established that this carbonaceous material is formed from organic vapours, and it is now recognized that the principal source is the oil-sealed rotary pumps which provide the backing vacuum. It has been shown that the organic vapours consist of low molecular weight fragments of oil molecules which have been degraded at hot spots produced by friction between the vanes and the surfaces on which they slide. As satisfactory oil-free pumps are unavailable, it is standard electron microscope practice to reduce the partial pressure of organic vapours in the microscope in the vicinity of the specimen by using liquid-nitrogen cooled anti-contamination devices. Traps of this type are sufficient to reduce the contamination rate to about 0.1 Å per min, which is tolerable for many investigations.

Improved 3-D reconstruction using stereo computer graphics and multiple tilt EM images

1995 ◽  
Vol 53 ◽  
pp. 630-631
Author(s):  
Lee D. Peachey ◽  
Lou Fodor ◽  
John C. Haselgrove ◽  
Stanley M. Dunn ◽  
Junqing Huang
Keyword(s):  
Computer Graphics ◽  
High Performance ◽  
Transverse Section ◽  
Three Dimensional ◽  
Stereo Pair ◽  
3D Reconstructions ◽  
Video Cameras ◽  
Biological Objects ◽  
Microscope Images ◽  
High Performance Computer

Stereo pairs of electron microscope images provide valuable visual impressions of the three-dimensional nature of specimens, including biological objects. Beyond this one seeks quantitatively accurate models and measurements of the three dimensional positions and sizes of structures in the specimen. In our laboratory, we have sought to combine high resolution video cameras with high performance computer graphics systems to improve both the ease of building 3D reconstructions and the accuracy of 3D measurements, by using multiple tilt images of the same specimen tilted over a wider range of angles than can be viewed stereoscopically. Ultimately we also wish to automate the reconstruction and measurement process, and have initiated work in that direction.Figure 1 is a stereo pair of 400 kV images from a 1 micrometer thick transverse section of frog skeletal muscle stained with the Golgi stain. This stain selectively increases the density of the transverse tubular network in these muscle cells, and it is this network that we reconstruct in this example.

Design of an intermediate high voltage EM for 3-D studies of biological material and its integration with a system for remote access

1995 ◽  
Vol 53 ◽  
pp. 66-67 ◽  
Author(s):  
Mark H. Ellisman
Keyword(s):  
High Voltage ◽  
High Performance ◽  
Remote Access ◽  
3 Dimensional ◽  
Voltage Electron ◽  
Remote Operation ◽  
High Voltage Electron Microscope ◽  
La Jolla ◽  
Performance Computing ◽  
Advanced Version

The increased availability of High Performance Computing and Communications (HPCC) offers scientists and students the potential for effective remote interactive use of centralized, specialized, and expensive instrumentation and computers. Examples of instruments capable of remote operation that may be usefully controlled from a distance are increasing. Some in current use include telescopes, networks of remote geophysical sensing devices and more recently, the intermediate high voltage electron microscope developed at the San Diego Microscopy and Imaging Resource (SDMIR) in La Jolla. In this presentation the imaging capabilities of a specially designed JEOL 4000EX IVEM will be described. This instrument was developed mainly to facilitate the extraction of 3-dimensional information from thick sections. In addition, progress will be described on a project now underway to develop a more advanced version of the Telemicroscopy software we previously demonstrated as a tool to for providing remote access to this IVEM (Mercurio et al., 1992; Fan et al., 1992).

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