Determination of interface and bulk traps in the subthreshold region of polycrystalline silicon thin-film transistors

2003 ◽  
Vol 50 (9) ◽  
pp. 1991-1994 ◽  
Author(s):  
N.A. Hastas ◽  
D.H. Tassis ◽  
C.A. Dimitriadis ◽  
G. Kamarinos
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Subthreshold Region

Determination of excess current due to impact ionization in polycrystalline silicon thin-film transistors

1998 ◽  
Vol 42 (4) ◽  
pp. 613-618 ◽  
Author(s):  
I. Policicchio ◽  
A. Pecora ◽  
R. Carluccio ◽  
L. Mariucci ◽  
G. Fortunato ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Impact Ionization ◽  
Silicon Thin Film ◽  
Excess Current

Determination of hot-carrier induced interface state density in polycrystalline silicon thin-film transistors

1998 ◽  
Vol 84 (4) ◽  
pp. 2341-2348 ◽  
Author(s):  
L. Mariucci ◽  
G. Fortunato ◽  
R. Carluccio ◽  
A. Pecora ◽  
S. Giovannini ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Interface State ◽  
State Density ◽  
Interface State Density ◽  
Silicon Thin Film ◽  
Hot Carrier

Determination of bulk states and interface states distributions in polycrystalline silicon thin‐film transistors

1993 ◽  
Vol 74 (4) ◽  
pp. 2919-2924 ◽  
Author(s):  
C. A. Dimitriadis ◽  
D. H. Tassis ◽  
N. A. Economou ◽  
A. J. Lowe
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Interface States ◽  
Silicon Thin Film

Determination of bulk and interface density of states in polycrystalline silicon thin film transistors

2007 ◽  
Vol 515 (19) ◽  
pp. 7581-7584 ◽  
Author(s):  
N. Arpatzanis ◽  
C.A. Dimitriadis ◽  
S. Siskos ◽  
A.A. Hatzopoulos ◽  
G. Kamarinos
Keyword(s):  
Thin Film ◽  
Density Of States ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

scholarly journals Technology, performance and degradation characteristics of SLS ELA thin film transistors

2013 ◽  
Vol 26 (3) ◽  
pp. 247-280
Author(s):  
Despina Moschou ◽  
Dimitrios Kouvatsos ◽  
Giannis Kontogiannopoulos ◽  
Filippos Farmakis ◽  
Apostolos Voutsas
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
High Performance ◽  
Flat Panel Displays ◽  
Technological Parameters ◽  
Large Area ◽  
Silicon Thin Film

Low temperature polycrystalline silicon thin film transistors (LTPS poly-Si TFTs) are essential for large area electronics and high performance flat panel displays. In recent years, LTPS TFT performance has substantially increased due to the important breakthroughs in the field of polycrystalline silicon crystallization and also due to the optimization of the process steps that differ from those of typical MOSFETs, mainly because of the requirement for low temperature procedures. In this review we present the electrical characteristics of polycrystalline silicon TFTs, crystallized with different variations of the advanced SLS ELA technique, and the determination of process technological parameters that affect the device performance, in order to further optimize the production of such high performance transistors, in terms of poly-Si microstructure, channel dimensions and topology. Also, the effect of these fabrication parameters on device degradation characteristics is studied, with an attempt to model and predict degradation characteristics.

Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

2000 ◽  
Vol 76 (17) ◽  
pp. 2442-2444 ◽  
Author(s):  
C. T. Angelis ◽  
C. A. Dimitriadis ◽  
F. V. Farmakis ◽  
J. Brini ◽  
G. Kamarinos ◽  
...  
Keyword(s):  
Thin Film ◽  
Excimer Laser ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

Dynamic-Gate-Stress-Induced Degradation in Bridged-Grain Polycrystalline Silicon Thin-Film Transistors

2016 ◽  
Vol 63 (10) ◽  
pp. 3964-3970 ◽  
Author(s):  
Meng Zhang ◽  
Zhihe Xia ◽  
Wei Zhou ◽  
Rongsheng Chen ◽  
Man Wong ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

Two‐step annealed polycrystalline silicon thin‐film transistors

1996 ◽  
Vol 80 (3) ◽  
pp. 1883-1890 ◽  
Author(s):  
Kwon‐Young Choi ◽  
Min‐Koo Han
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film
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