Memory characterization of SiGe quantum dot flash memories with HfO/sub 2/ and SiO/sub 2/ tunneling dielectrics
2003 ◽
Vol 50
(9)
◽
pp. 1823-1829
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2006 ◽
Vol 1113
(1-2)
◽
pp. 251-254
◽
2012 ◽
Vol 209
(6)
◽
pp. 1163-1167
◽
2015 ◽
Vol 30
(7)
◽
pp. 890-895
◽
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