Diagnosis of Multiple Hold-Time and Setup-Time Faults in Scan Chains

2005 ◽  
Vol 54 (11) ◽  
pp. 1467-1472 ◽  
Author(s):  
J.C.-M. Li
Keyword(s):  
Hold Time ◽  
Setup Time ◽  
Scan Chains

Diagnose Compound Hold Time Faults Caused by Spot Delay Defects at Clock Tree

2011 ◽  
Author(s):  
Yu Huang ◽  
Wu-Tung Cheng ◽  
Ting-Pu Tai ◽  
Liyang Lai ◽  
Ruifeng Guo ◽  
...  
Keyword(s):  
Hold Time ◽  
Clock Signal ◽  
Clock Tree ◽  
Scan Testing ◽  
Design Error ◽  
Functional Logic ◽  
Scan Chains ◽  
Delay Defects

Abstract If a signal on clock tree is slower than expected due to either a design error or a manufacturing defect, it may cause complicated fault behaviors during scan-based testing. It makes the diagnosis of such defect especially difficult if the defective clock signal is used for both shift and capture operations during the scan testing, because (1) the defect induces hold time faults on scan chains during shift cycles, and (2) hold-time faults may also be introduced during capture cycles in the functional logic paths. In this paper we illustrate the failure behaviors of such clock defects and propose an algorithm to diagnose it.

Robust paradigm for diagnosing hold-time faults in scan chains

2007 ◽  
Vol 1 (6) ◽  
pp. 706 ◽  
Author(s):  
C.-W. Tzeng ◽  
J.-J. Hsu ◽  
S.-Y. Huang
Keyword(s):  
Hold Time ◽  
Scan Chains

scholarly journals Performance Analysis of Non-Identical Master Slave Flip Flops at 65nm Node

2019 ◽  
Vol 9 (1S) ◽  
pp. 18-21
Keyword(s):  
Performance Analysis ◽  
Supply Voltage ◽  
Hold Time ◽  
Setup Time ◽  
Percentage Reduction ◽  
Flip Flop ◽  
Logic Structure

This paper presents the performance analysis of the different master slave flip flop reported and comparison of their parameters such as power, area, delay setup time and hold time. To reduce the number of transistor count various logic structure mater slave design have been proposed that results reduction in total area of the flip flop. Advantage and disadvantage of the each flip flop has been discussed. Process corner analysis of all flip flop is also presented at supply voltage of 0.7 volts at 27°C temperature. Percentage reduction in power and speed of operation i.e. frequency are discussed

On Debugging Intermittent Chain Hold-time Failures Caused by Process Variations for FinFET Technology

2020 ◽  
Author(s):  
Huaxing Tang ◽  
Allen Yang ◽  
Zhanjun Shu ◽  
Eden Cai ◽  
Shizhong Chen ◽  
...  
Keyword(s):  
Standard Method ◽  
Hold Time ◽  
Process Variations ◽  
Manufacturing Defects ◽  
Test Compression ◽  
Yield Learning ◽  
Scan Chains

Abstract Scan-based test has been the industrial standard method for screening manufacturing defects. Scan chains are vulnerable to most manufacturing defects and process variations. Therefore, chain failures diagnosis is critical for successful yield learning. However, traditional chain diagnosis requires failing masking patterns to identify faulty chains and their fault types for designs with test compression. In other words, it cannot diagnose the chain failures which don't fail the masking chain patterns. Unfortunately, advanced FinFET technologies with more manufacturing challenges and higher process variations may result in more subtle chain timing failures which can't be detected by chain masking patterns. In this work, we present a new debugging methodology, which combines chain diagnosis and tester-based test to effectively diagnose such intermittent chain failures. The proposed methodology is validated on silicon data for one modern large SOC design and successfully identified all scan cells with hold-time issues, which were validated by STA with corrected models. The subsequent mask fixes for these identified hold-time violations resolved this yield issue and dramatically improve the yield.

Skin Cooling on Breath-Hold Duration and Predicted Emergency Air Supply Duration During Immersion

2020 ◽  
Vol 91 (7) ◽  
pp. 578-585
Author(s):  
Victory C. Madu ◽  
Heather Carnahan ◽  
Robert Brown ◽  
Kerri-Ann Ennis ◽  
Kaitlyn S. Tymko ◽  
...  
Keyword(s):  
Minute Ventilation ◽  
Hold Time ◽  
Whole Body ◽  
Breath Hold ◽  
Endurance Time ◽  
Skin Exposure ◽  
Breathing Apparatus ◽  
Air Supply ◽  
Skin Cooling ◽  
Breath Hold Duration

PURPOSE: This study was intended to determine the effect of skin cooling on breath-hold duration and predicted emergency air supply duration during immersion.METHODS: While wearing a helicopter transport suit with a dive mask, 12 subjects (29 ± 10 yr, 78 ± 14 kg, 177 ± 7 cm, 2 women) were studied in 8 and 20°C water. Subjects performed a maximum breath-hold, then breathed for 90 s (through a mouthpiece connected to room air) in five skin-exposure conditions. The first trial was out of water for Control (suit zipped, hood on, mask off). Four submersion conditions included exposure of the: Partial Face (hood and mask on); Face (hood on, mask off); Head (hood and mask off); and Whole Body (suit unzipped, hood and mask off).RESULTS: Decreasing temperature and increasing skin exposure reduced breath-hold time (to as low as 10 ± 4 s), generally increased minute ventilation (up to 40 ± 15 L · min−1), and decreased predicted endurance time (PET) of a 55-L helicopter underwater emergency breathing apparatus. In 8°C water, PET decreased from 2 min 39 s (Partial Face) to 1 min 11 s (Whole Body).CONCLUSION: The most significant factor increasing breath-hold and predicted survival time was zipping up the suit. Face masks and suit hoods increased thermal comfort. Therefore, wearing the suits zipped with hoods on and, if possible, donning the dive mask prior to crashing, may increase survivability. The results have important applications for the education and preparation of helicopter occupants. Thermal protective suits and dive masks should be provided.Madu VC, Carnahan H, Brown R, Ennis K-A, Tymko KS, Hurrie DMG, McDonald GK, Cornish SM, Giesbrecht GG. Skin cooling on breath-hold duration and predicted emergency air supply duration during immersion. Aerosp Med Hum Perform. 2020; 91(7):578–585.

Designing an Energy Efficient Scheme in MANET using Reconfigurable Directional (RDA) Algorithm

2018 ◽  
Vol 8 (4) ◽  
pp. 92
Author(s):  
Rinkle Chhabra ◽  
Anuradha Saini
Keyword(s):  
Ad Hoc ◽  
Energy Savings ◽  
Setup Time ◽  
Directional Antennas ◽  
Directional Antenna ◽  
Efficient Scheme ◽  
Primary Focus ◽  
Hoc Networks ◽  
Energy Gains ◽  
Insight Into

Mobile Ad Hoc Networks (MANET) are autonomous, infrastructure less and self-configuring networks. MANETs has gained lots of popularity due to on the fly deployment i.e. small network setup time and ability to provide communication in obstreperous terrains. Major challenges in MANETs include routing, energy efficiency, network topology control, security etc. Primary focus in this article is to provide method and algorithm to ensure significant energy savings using re-configurable directional antennas. Significant energy gains can be clinched using directional antenna. Key challenges while using directional antenna are to find destination location, antenna focusing, signal power and distance calculations. Re-configurable directional antenna can ensure significant energy gains if used intelligently. This article provides a brief insight into improved energy savings using re-configurable directional antennas and an associated algorithm

A New Technique for Scan Chain Failure Diagnosis

2002 ◽  
Author(s):  
Ruifeng Guo ◽  
Srikanth Venkataraman
Keyword(s):  
Hold Time ◽  
Failure Diagnosis ◽  
Second Step ◽  
Fault Type ◽  
Transition Faults ◽  
Input Side ◽  
Output Side ◽  
A New Technique ◽  
Scan Chain ◽  
Diagnostic Resolution

Abstract In this paper, we present a scan chain fault diagnosis procedure. The diagnosis for a single scan chain failure is performed in three steps. The first step uses special chain test patterns to determine both the faulty chain and the fault type in the faulty chain. The second step uses a novel procedure to generate special test patterns to identify the suspect scan cell within a range of scan cells. Unlike previously proposed methods that restrict the location of the faulty scan cell only from the scan chain output side, our method restricts the location of the faulty scan cell from both the scan chain output side and the scan chain input side. Hence the number of suspect scan cells is reduced significantly in this step. The final step further improves the diagnostic resolution by ranking the suspect scan cells inside this range. The proposed technique handles both stuck-at and timing failures (transition faults and hold time faults). The experimental results based on simulation and silicon units for several products show the effectiveness of the proposed method.

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