scholarly journals A mm-Wave Patch Antenna with Broad Bandwidth and a Wide Angular Range

2017 ◽  
Vol 65 (8) ◽  
pp. 4293-4298 ◽  
Author(s):  
Jonas Kornprobst ◽  
Kun Wang ◽  
Gerhard Hamberger ◽  
Thomas F. Eibert
Keyword(s):  
Patch Antenna ◽  
Angular Range ◽  
Broad Bandwidth

scholarly journals Bandwidth Enhancement of Microstrip Patch Antenna Using Complementary Rhombus Resonator

2018 ◽  
Vol 2018 ◽  
pp. 1-8 ◽  
Author(s):  
Lei Tao ◽  
Jianchun Xu ◽  
Haihong Li ◽  
Yanan Hao ◽  
Shanguo Huang ◽  
...  
Keyword(s):  
Patch Antenna ◽  
Microstrip Patch Antenna ◽  
Broadband Antenna ◽  
Bandwidth Enhancement ◽  
Broad Bandwidth ◽  
Microstrip Patch ◽  
Low Profile ◽  
Additional Resonance ◽  
Parametric Studies ◽  
Working Principle

By using complementary rhombus resonator (CRR), a small-size and low-profile microstrip patch antenna (MPA) with broad bandwidth has been proposed. Parametric studies were conducted to illustrate the working principle of the proposed antenna. An additional resonance is introduced by the CRR to broaden the bandwidth. Compared with the MPA without the CRR, the bandwidth of the proposed antenna is increased by 200%. The measured results are in good agreements with the simulated ones, which demonstrate that this design provides a way to obtain the broadband antenna.

Design of Ultra-Thin and Compact Metamaterial Monopolar Patch Antenna with Broad Bandwidth

Frequenz ◽  
2017 ◽  
Vol 72 (1-2) ◽  
Author(s):  
Bi-Cheng Lin ◽  
Guang-Ming Wang
Keyword(s):  
Patch Antenna ◽  
Effective Permeability ◽  
Broad Bandwidth

AbstractA novel magneto-electro-dielectric waveguided metamaterial (MED-WG-MTM) that the effective permeability

Dual‐band slot‐coupled patch antenna with broad bandwidth and high directivity for WLAN access point

2014 ◽  
Vol 50 (10) ◽  
pp. 726-728 ◽  
Author(s):  
Insu Yeom ◽  
Jin Myung Kim ◽  
Chang Won Jung
Keyword(s):  
Patch Antenna ◽  
Access Point ◽  
Dual Band ◽  
Broad Bandwidth

A linearity test for thick specimens imaged by HVEM over a 180° angular range

1991 ◽  
Vol 49 ◽  
pp. 552-553
Author(s):  
Yu Liu
Keyword(s):  
Phase Contrast ◽  
Three Dimensional ◽  
Angular Range ◽  
Two Dimensional ◽  
Back Projection ◽  
Line Integral ◽  
Exponential Law ◽  
Transmission Electron ◽  
Absorption Law ◽  
Linearity Test

The image obtained in a transmission electron microscope is the two-dimensional projection of a three-dimensional (3D) object. The 3D reconstruction of the object can be calculated from a series of projections by back-projection, but this algorithm assumes that the image is linearly related to a line integral of the object function. However, there are two kinds of contrast in electron microscopy, scattering and phase contrast, of which only the latter is linear with the optical density (OD) in the micrograph. Therefore the OD can be used as a measure of the projection only for thin specimens where phase contrast dominates the image. For thick specimens, where scattering contrast predominates, an exponential absorption law holds, and a logarithm of OD must be used. However, for large thicknesses, the simple exponential law might break down due to multiple and inelastic scattering.

Mosaic Mapping: A Means of Tiling Images to Shorten Acquisition Speed for Lower - Magnification SEM Images and Wavelength Dispersive Spectrometers (WDS) X-Ray Maps

1996 ◽  
Vol 54 ◽  
pp. 438-439
Author(s):  
J.D. Geller ◽  
C.R. Herrington
Keyword(s):  
Limiting Factors ◽  
X Rays ◽  
Angular Range ◽  
Acceptance Angle ◽  
Sem Images ◽  
Worst Case ◽  
X Ray ◽  
Focusing Distance ◽  
Layered Crystals ◽  
Working Distance

The minimum magnification for which an image can be acquired is determined by the design and implementation of the electron optical column and the scanning and display electronics. It is also a function of the working distance and, possibly, the accelerating voltage. For secondary and backscattered electron images there are usually no other limiting factors. However, for x-ray maps there are further considerations. The energy-dispersive x-ray spectrometers (EDS) have a much larger solid angle of detection that for WDS. They also do not suffer from Bragg’s Law focusing effects which limit the angular range and focusing distance from the diffracting crystal. In practical terms EDS maps can be acquired at the lowest magnification of the SEM, assuming the collimator does not cutoff the x-ray signal. For WDS the focusing properties of the crystal limits the angular range of acceptance of the incident x-radiation. The range is dependent upon the 2d spacing of the crystal, with the acceptance angle increasing with 2d spacing. The natural line width of the x-ray also plays a role. For the metal layered crystals used to diffract soft x-rays, such as Be - O, the minimum magnification is approximately 100X. In the worst case, for the LEF crystal which diffracts Ti - Zn, ˜1000X is the minimum.

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