Three-Dimension $H_\infty$ Guidance Law and Capture Region Analysis

2012 ◽  
Vol 48 (1) ◽  
pp. 419-429 ◽  
Author(s):  
Li-Jun Liu ◽  
Yi Shen
Keyword(s):  
Three Dimension ◽  
Region Analysis ◽  
Guidance Law ◽  
Capture Region

scholarly journals Capture region for a realistic TPN guidance law

1993 ◽  
Vol 29 (3) ◽  
pp. 995-1003 ◽  
Author(s):  
A. Dhar ◽  
D. Ghose
Keyword(s):  
Guidance Law ◽  
Capture Region

Local thickness determination by Electron Energy Loss Spectroscopy

1994 ◽  
Vol 52 ◽  
pp. 944-945
Author(s):  
Suichu Luo ◽  
John R. Dunlap ◽  
Richard W. Williams ◽  
David C. Joy
Keyword(s):  
Energy Loss ◽  
Analytical Electron Microscopy ◽  
Mean Free Path ◽  
Single Scattering ◽  
Specimen Thickness ◽  
Three Dimension ◽  
Angular Correction ◽  
Electron Intensity ◽  
Image Position ◽  
Inelastic Mean Free Path

In analytical electron microscopy, it is often important to know the local thickness of a sample. The conventional method used for measuring specimen thickness by EELS is:where t is the specimen thickness, λi is the total inelastic mean free path, IT is the total intensity in an EEL spectrum, and I0 is the zero loss peak intensity. This is rigorouslycorrect only if the electrons are collected over all scattering angles and all energy losses. However, in most experiments only a fraction of the scattered electrons are collected due to a limited collection semi-angle. To overcome this problem we present a method based on three-dimension Poisson statistics, which takes into account both the inelastic and elastic mixed angular correction.The three-dimension Poisson formula is given by:where I is the unscattered electron intensity; t is the sample thickness; λi and λe are the inelastic and elastic scattering mean free paths; Si (θ) and Se(θ) are normalized single inelastic and elastic angular scattering distributions respectively ; F(E) is the single scattering normalized energy loss distribution; D(E,θ) is the plural scattering distribution,

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