Reconsideration of off-leakage current estimation of sub-100-nm SOI MOSFETs and device selection for applications

Author(s):  
S.-I. Ynagi ◽  
Y. Omura
Author(s):  
Chris Schuermyer ◽  
Brady Benware ◽  
Graham Rhodes ◽  
Davide Appello ◽  
Vincenzo Tancorre ◽  
...  

Abstract This work presents the first application of a diagnosis driven approach for identifying systematic chain fail defects in order to reduce the time spent in failure analysis. The zonal analysis methodology that is applied separates devices into systematic and random populations of chain fails in order to prevent submitting random defects for failure analysis. Two silicon case studies are presented to validate the production worthiness of diagnosis driven yield analysis for chain fails. The defects uncovered in these case studies are very subtle and would be difficult to identify with any other methodology.


2017 ◽  
Vol 15 (10) ◽  
pp. 787-796 ◽  
Author(s):  
Carlo Setacci ◽  
Mariagnese Mele ◽  
Gianmarco de Donato ◽  
Giulia Mazzitelli ◽  
Domenico Benevento ◽  
...  

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 219820-219836
Author(s):  
Muhammad Asad ◽  
Saad Qaisar ◽  
Abdul Basit

2020 ◽  
Vol 13 (4) ◽  
pp. 249-256
Author(s):  
Lung-Hui Tsai ◽  
Hsi-Pao Hsieh ◽  
Po-Sen Chen ◽  
Chia-Lin Jou ◽  
Kai-yuan Tseng ◽  
...  

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