Fiber-optic thermometer for high temperature measurement

2006 ◽  
Author(s):  
Hiroaki Aizawa ◽  
Tooru Katsumata ◽  
Shuji Komuro ◽  
Takitaro Morikawa ◽  
Hiroaki Ishizawa ◽  
...  
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
Fiber Optic ◽  
High Temperature Measurement

Fiber-optic Mach–Zehnder interferometric sensor for high-sensitivity high temperature measurement

2013 ◽  
Vol 300 ◽  
pp. 194-198 ◽  
Author(s):  
Yun Liu ◽  
Wei Peng ◽  
Yuzhang Liang ◽  
Xinpu Zhang ◽  
Xinlei Zhou ◽  
...  
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
Fiber Optic ◽  
High Sensitivity ◽  
High Temperature Measurement ◽  
Interferometric Sensor

scholarly journals Hollow-Core Fiber-Tip Interferometric High-Temperature Sensor Operating at 1100 °C with High Linearity

Micromachines ◽  
2021 ◽  
Vol 12 (3) ◽  
pp. 234
Author(s):  
Zhe Zhang ◽  
Baijie Xu ◽  
Min Zhou ◽  
Weijia Bao ◽  
Xizhen Xu ◽  
...  
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
Fiber Optic ◽  
Thermal Hysteresis ◽  
Single Mode ◽  
Hollow Core ◽  
Excellent Thermal Stability ◽  
High Linearity ◽  
High Temperature Measurement ◽  
Core Fiber

Over decades, fiber-optic temperature sensors based on conventional single-mode fibers (SMF) have been demonstrated with either high linearity and stability in a limited temperature region or poor linearity and thermal hysteresis in a high-temperature measurement range. For high-temperature measurements, isothermal annealing is typically necessary for the fiber-optic sensors, aiming at releasing the residual stress, eliminating the thermal hysteresis and, thus, improving the high-temperature measurement linearity and stability. In this article, an annealing-free fiber-optic high-temperature (1100 °C) sensor based on a diaphragm-free hollow-core fiber (HCF) Fabry-Perot interferometer (FPI) is proposed and experimentally demonstrated. The proposed sensor exhibits an excellent thermal stability and linearity (R2 > 0.99 in a 100–1100 °C range) without the need for high-temperature annealing. The proposed sensor is extremely simple in preparation, and the annealing-free property can reduce the cost of sensor production significantly, which is promising in mass production and industry applications.

Research Status and Development Prospect of Optical Fiber High-Temperature Sensors

2013 ◽  
Vol 860-863 ◽  
pp. 1388-1393
Author(s):  
Guo Chang Zhao ◽  
Xian Yi Tong ◽  
Li Ping Song ◽  
Chun Lei Zhao ◽  
Guang Chao Li ◽  
...  
Keyword(s):  
High Temperature ◽  
Optical Fiber ◽  
Temperature Measurement ◽  
Fiber Optic ◽  
Cost Effective ◽  
Temperature Sensors ◽  
High Temperature Measurement ◽  
Wide Range ◽  
Effective Option ◽  
Accurate Temperature Measurement

Accurate temperature measurement needs in both research and industry have become more demanding and traditional temperature measurement technologies are struggling to keep up. Optical fiber thermometers have many unique advantages and are an option with much potential in the area of high temperature measurement. Research shows that fiber optic temperature sensors are capable of making accurate and precise measurements in a wide range of harsh conditions where other measurement technologies cannot and are a cost effective option in situations where traditional measurement technologies are currently used. Several typical high temperature fiber optic sensors are discussed in detail, focusing on the principle of operation, advantageous characteristics, and recent research developments, with the aim of aiding in further work with fiber optic thermometers.

Integrated Fiber Optic Sensor System for High Temperature Measurement

2018 ◽  
Author(s):  
Chung-Yen Chao ◽  
Daniel Robinson ◽  
Victor Grubsky ◽  
Robert Li ◽  
Sonny Hoang ◽  
...  
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
Fiber Optic ◽  
Fiber Optic Sensor ◽  
Sensor System ◽  
Optic Sensor ◽  
High Temperature Measurement

Study on characteristics of schottky temperature detector based on metal/n-ZnO/n-Si structures

2020 ◽  
Vol 12 ◽  
Author(s):  
Fang Wang ◽  
Jingkai Wei ◽  
Caixia Guo ◽  
Tao Ma ◽  
Linqing Zhang ◽  
...  
Keyword(s):  
High Temperature ◽  
Temperature Measurement ◽  
Temperature Response ◽  
Large Temperature ◽  
Mems Devices ◽  
Temperature Range ◽  
Response Characteristics ◽  
High Temperature Measurement ◽  
Temperature Detector ◽  
Schottky Structure

Background: At present, the main problems of Micro-Electro-Mechanical Systems (MEMS) temperature detector focus on the narrow range of temperature detection, difficulty of the high temperature measurement. Besides, MEMS devices have different response characteristics for various surrounding temperature in the petrochemical and metallurgy application fields with high-temperature and harsh conditions. To evaluate the performance stability of the hightemperature MEMS devices, the real-time temperature measurement is necessary. Objective: A schottky temperature detector based on the metal/n-ZnO/n-Si structures is designed to measure high temperature (523~873K) for the high-temperature MEMS devices with large temperature range. Method: By using the finite element method (FEM), three different work function metals (Cu, Ni and Pt) contact with the n-ZnO are investigated to realize Schottky. At room temperature (298K) and high temperature (523~873K), the current densities with various bias voltages (J-V) are studied. Results: The simulation results show that the high temperature response power consumption of three schottky detectors of Cu, Ni and Pt decreases successively, which are 1.16 mW, 63.63 μW and 0.14 μW. The response temperature sensitivities of 6.35 μA/K, 0.78 μA/K, and 2.29 nA/K are achieved. Conclusion: The Cu/n-ZnO/n-Si schottky structure could be used as a high temperature detector (523~873K) for the hightemperature MEMS devices. It has a large temperature range (350K) and a high response sensitivity is 6.35 μA/K. Compared with traditional devices, the Cu/n-ZnO/n-Si Schottky structure based temperature detector has a low energy consumption of 1.16 mW, which has potential applications in the high-temperature measurement of the MEMS devices.

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