A novel micro optical system employing inclined polymer mirrors and Fresnel lens for monolithic integration of optical disk pickup heads

Author(s):  
Fan-Gang Tseng ◽  
Heng-Tsang Hu
2007 ◽  
Vol 51 (94) ◽  
pp. 1524
Author(s):  
Li-Chen Jia ◽  
Peng-Hui Mao ◽  
Yu-Xiang Zheng ◽  
Rong-Jun Zhang ◽  
Liang-Yao Chen

1998 ◽  
Author(s):  
Michio Miura ◽  
Takashi Katsuki ◽  
Yoshiro Ishikawa ◽  
Satoshi Ueda ◽  
Ippei Sawaki ◽  
...  
Keyword(s):  

2010 ◽  
Vol 447-448 ◽  
pp. 101-105 ◽  
Author(s):  
Jae Young Joo ◽  
Chang Suk Kang ◽  
Soon Sub Park ◽  
Sun Kyu Lee

In this paper, we demonstrated the machining process of a novel Light Emitting Diodes (LED) beam shaping lens, called TIR Fresnel lens, for GaN-based blue Chip Scale Packaged (CSP) LEDs. Upon achieving a precise alignment of the tool and identifying the best manufacturing condition, we have successfully fabricated a prototype of this lens on poly methyl methacrylate (PMMA) plate. The form error of the central aspheric lens was less than 1 μm deviation, and surface quality of the Fresnel facets were sufficient for Total Internal refraction without any burr or adhesion of the machined chip. Fabricated TIR Fresnel lens reduced the viewing angle of the testing CSP LED from 140° to 17.4° in FWHM. The proposed lens produced extreme compactness as well as high collimation efficiency, thereby applicable to an ultra-thin optical system.


2002 ◽  
Author(s):  
Masaaki Takita ◽  
Yoshihiro Okino ◽  
Sumio Nakahara

1984 ◽  
Vol 50 (12) ◽  
pp. 1850-1856
Author(s):  
NOBUHIDE MATSUBAYSSHI
Keyword(s):  

Author(s):  
Michel Troyonal ◽  
Huei Pei Kuoal ◽  
Benjamin M. Siegelal

A field emission system for our experimental ultra high vacuum electron microscope has been designed, constructed and tested. The electron optical system is based on the prototype whose performance has already been reported. A cross-sectional schematic illustrating the field emission source, preaccelerator lens and accelerator is given in Fig. 1. This field emission system is designed to be used with an electron microscope operated at 100-150kV in the conventional transmission mode. The electron optical system used to control the imaging of the field emission beam on the specimen consists of a weak condenser lens and the pre-field of a strong objective lens. The pre-accelerator lens is an einzel lens and is operated together with the accelerator in the constant angular magnification mode (CAM).


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