A Reflected Light-receiver With 2nA Sensitivity Using CDS And A Separate Lowpass-filtering Of The Input Signal At Each Clock-phase

2005 ◽  
Author(s):  
D. Killat ◽  
R. Schmitz
Keyword(s):  
Input Signal ◽  
Reflected Light ◽  
Lowpass Filtering

Confocal laser microscopy of impregnated central nervous system tissue

1988 ◽  
Vol 46 ◽  
pp. 94-95
Author(s):  
J.N. Turner ◽  
M. Siemens ◽  
D. Szarowski ◽  
D.N. Collins
Keyword(s):  
Electron Microscopy ◽  
Central Nervous System ◽  
Nervous System ◽  
Three Dimensional ◽  
Dimensional Structure ◽  
Confocal Laser ◽  
High Contrast ◽  
Central Nervous System Tissue ◽  
Tissue Samples ◽  
Reflected Light

A classic preparation of central nervous system tissue (CNS) is the Golgi procedure popularized by Cajal. The method is partially specific as only a few cells are impregnated with silver chromate usualy after osmium post fixation. Samples are observable by light (LM) or electron microscopy (EM). However, the impregnation is often so dense that structures are masked in EM, and the osmium background may be undesirable in LM. Gold toning is used for a subtle but high contrast EM preparation, and osmium can be omitted for LM. We are investigating these preparations as part of a study to develop correlative LM and EM (particularly HVEM) methodologies in neurobiology. Confocal light microscopy is particularly useful as the impregnated cells have extensive three-dimensional structure in tissue samples from one to several hundred micrometers thick. Boyde has observed similar preparations in the tandem scanning reflected light microscope (TSRLM).

Some early history of replica techniques for electron microscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1076-1077
Author(s):  
Robert M. Fisher
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Optical Microscope ◽  
Early History ◽  
Bulk Materials ◽  
Thin Sections ◽  
Transmission Electron ◽  
Reflected Light ◽  
History Of ◽  
Electron Microscopes

By 1940, a half dozen or so commercial or home-built transmission electron microscopes were in use for studies of the ultrastructure of matter. These operated at 30-60 kV and most pioneering microscopists were preoccupied with their search for electron transparent substrates to support dispersions of particulates or bacteria for TEM examination and did not contemplate studies of bulk materials. Metallurgist H. Mahl and other physical scientists, accustomed to examining etched, deformed or machined specimens by reflected light in the optical microscope, were also highly motivated to capitalize on the superior resolution of the electron microscope. Mahl originated several methods of preparing thin oxide or lacquer impressions of surfaces that were transparent in his 50 kV TEM. The utility of replication was recognized immediately and many variations on the theme, including two-step negative-positive replicas, soon appeared. Intense development of replica techniques slowed after 1955 but important advances still occur. The availability of 100 kV instruments, advent of thin film methods for metals and ceramics and microtoming of thin sections for biological specimens largely eliminated any need to resort to replicas.

Tandem scanning reflected light microscopy: How it works and applications

1986 ◽  
Vol 44 ◽  
pp. 84-87
Author(s):  
Alan Boyde ◽  
Milan Hadravský ◽  
Mojmír Petran ◽  
Timothy F. Watson ◽  
Sheila J. Jones ◽  
...  
Keyword(s):  
Light Microscopy ◽  
Focal Plane ◽  
Central Symmetry ◽  
Single Line ◽  
Scanning Microscope ◽  
Reflected Light ◽  
Illuminating Light ◽  
Illuminating Beam

The principles of tandem scanning reflected light microscopy and the design of recent instruments are fully described elsewhere and here only briefly. The illuminating light is intercepted by a rotating aperture disc which lies in the intermediate focal plane of a standard LM objective. This device provides an array of separate scanning beams which light up corresponding patches in the plane of focus more intensely than out of focus layers. Reflected light from these patches is imaged on to a matching array of apertures on the opposite side of the same aperture disc and which are scanning in the focal plane of the eyepiece. An arrangement of mirrors converts the central symmetry of the disc into congruency, so that the array of apertures which chop the illuminating beam is identical with the array on the observation side. Thus both illumination and “detection” are scanned in tandem, giving rise to the name Tandem Scanning Microscope (TSM). The apertures are arranged on Archimedean spirals: each opposed pair scans a single line in the image.

Input Signal Voltage Variation and its Effects on Non Invasive Bio-impedance Diagnosis

2011 ◽  
Vol 4 (2) ◽  
pp. 13-14
Author(s):  
Hari Krishnan G Hari Krishnan G ◽  
◽  
Dr. Ananda Natarajan R ◽  
Dr. Anima Nanda
Keyword(s):  
Input Signal ◽  
Non Invasive ◽  
Voltage Variation

Modelling Light Transmission in a Fiber-Optical Reflection System

2004 ◽  
Vol 9 (1) ◽  
pp. 55-63
Author(s):  
V. Kleiza
Keyword(s):  
Optical Sensors ◽  
Light Transmission ◽  
External Cavity ◽  
Linear Displacement ◽  
Fiber System ◽  
Light Emitting ◽  
Optical Media ◽  
Reflected Light ◽  
Fiber Optical ◽  
Fiber Optical Sensors

Light transmission in the reflection fiber system, located in external optical media, has been investigated for application as sensors. The system was simulated by different models, including external cavity parameters such as the distance between light emitting and receiving fibers and mirror positioning distance. The sensitivity to a linear displacement of the sensors was studied as a function of the distance between the tips of the light emitting fiber and the center of the pair reflected light collecting fibers, by positioning a mirror. Physical fundamentals and operating principles of the advanced fiber optical sensors were revealed.

THE REALIZATION OF THE ITERATIVE METHOD OF THE LEAST SQUARES FOR THE ESTIMATION OF STATIC OBJECT PARAMETERS IN MATLAB ENVIRONMENT

2017 ◽  
pp. 28-36
Author(s):  
Galina Vasil’evna Troshina ◽  
Alexander Aleksandrovich Voevoda
Keyword(s):  
Parameter Estimation ◽  
Iterative Method ◽  
Least Squares ◽  
Input Signal ◽  
Layer Structure ◽  
Estimation Procedure ◽  
Parameter Estimation Procedure ◽  
Noise Simulation ◽  
Static Object ◽  
Object Parameters

It was suggested to use the system model working in real time for an iterative method of the parameter estimation. It gives the chance to select a suitable input signal, and also to carry out the setup of the object parameters. The object modeling for a case when the system isn't affected by the measurement noises, and also for a case when an object is under the gaussian noise was executed in the MatLab environment. The superposition of two meanders with different periods and single amplitude is used as an input signal. The model represents the three-layer structure in the MatLab environment. On the most upper layer there are units corresponding to the simulation of an input signal, directly the object, the unit of the noise simulation and the unit for the parameter estimation. The second and the third layers correspond to the simulation of the iterative method of the least squares. The diagrams of the input and the output signals in the absence of noise and in the presence of noise are shown. The results of parameter estimation of a static object are given. According to the results of modeling, the algorithm works well even in the presence of significant measurement noise. To verify the correctness of the work of an algorithm the auxiliary computations have been performed and the diagrams of the gain behavior amount which is used in the parameter estimation procedure have been constructed. The entry conditions which are necessary for the work of an iterative method of the least squares are specified. The understanding of this algorithm functioning principles is a basis for its subsequent use for the parameter estimation of the multi-channel dynamic objects.

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