Mixed-Mode Adaptation in Distributed Systems: A Case Study

Author(s):  
Karun N. Biyani ◽  
Sandeep S. Kulkarni
Author(s):  
Magdalena Sienkiewicz ◽  
Philippe Rousseille

Abstract This paper presents a case study on scan test reject in a mixed mode IC. It focuses on the smart use of combined mature FA techniques, such as Soft Defect Localization (SDL) and emission microscopy (EMMI), to localize a random scan test anomaly at the silicon bulk level.


2004 ◽  
Vol 41 (4) ◽  
pp. 297-306 ◽  
Author(s):  
Sheila Howell ◽  
Michael C. Harris ◽  
Simon A. Wilkinson ◽  
Catherine Zuluaga ◽  
Paul Voutier
Keyword(s):  

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