Investigation of Excimer Laser Annealing of Si using Photoluminescence at Room Temperature

Author(s):  
H. Bourdon ◽  
A. Halimaoui ◽  
J. Venturini ◽  
F. Gonzatti ◽  
D. Dutartre
2015 ◽  
Vol 424 ◽  
pp. 38-41 ◽  
Author(s):  
Daishi Shiojiri ◽  
Ryosuke Yamauchi ◽  
Daiji Fukuda ◽  
Nobuo Tsuchimine ◽  
Satoru Kaneko ◽  
...  

2004 ◽  
Vol 460 (1-2) ◽  
pp. 291-294 ◽  
Author(s):  
Wonsuk Chung ◽  
Michael O. Thompson ◽  
Paul Wickboldt ◽  
Daniel Toet ◽  
Paul G. Carey

2011 ◽  
Vol 95 (10) ◽  
pp. 2823-2830 ◽  
Author(s):  
E.V. Johnson ◽  
P. Prod'homme ◽  
C. Boniface ◽  
K. Huet ◽  
T. Emeraud ◽  
...  

1992 ◽  
Vol 283 ◽  
Author(s):  
Hiroshi Iwata ◽  
Tomoyuki Nohda ◽  
Satoshi Ishida ◽  
Takashi Kuwahara ◽  
Keiichi Sano ◽  
...  

ABSTRACTThe grain size of phosphorous (P)-doped poly-Si film has been enlarged to about 5000 Å by controlling the solidification velocity of molten Si during ArF excimer laser annealing. The drastically enlarged grain has few defects inside the grain. It has been confirmed that control of the solidification velocity is effective for P-doped poly-Si similar to the case of non-doped poly-Si films. In addition, a sheet resistance of 80 Ω/□ (ρ = 4 × 10-4 Ω · cm) has been achieved for very thin (500 Å) films by recrystallizing PECVD P-doped a-Si films.


2006 ◽  
Vol 45 (4A) ◽  
pp. 2726-2730 ◽  
Author(s):  
Naoya Kawamoto ◽  
Atsushi Masuda ◽  
Naoto Matsuo ◽  
Yasuhiro Seri ◽  
Toshimasa Nishimori ◽  
...  

1998 ◽  
Vol 136 (4) ◽  
pp. 298-305 ◽  
Author(s):  
A.L Stepanov ◽  
D.E Hole ◽  
A.A Bukharaev ◽  
P.D Townsend ◽  
N.I Nurgazizov

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