Non-Destructive Characterization of Metal-Semiconductor Interface by Raman Scattering
Non-destructive characterization of polymer/metal interfaces using surface-enhanced Raman scattering
1991 ◽
Vol 17
(7)
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pp. 448-456
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1993 ◽
Vol 20
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pp. 341-351
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1990 ◽
Vol 126
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pp. 245-252
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1997 ◽
Vol 28
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pp. 195-197
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2004 ◽
Vol 270-273
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pp. 89-95
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2011 ◽
Vol 50
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pp. 906-917
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