Non-Destructive Characterization of Metal-Semiconductor Interface by Raman Scattering

Author(s):  
Hiroshi Harima
2017 ◽  
Vol 25 (6) ◽  
pp. 42-47 ◽  
Author(s):  
Reeju Pokharel ◽  
Donald W. Brown ◽  
Bjørn Clausen ◽  
Darrin D. Byler ◽  
Timothy L. Ickes ◽  
...  

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