scholarly journals SAFER SLOTH: Efficient, hardware-tailored memory protection

2014 ◽  
Author(s):  
Daniel Danner ◽  
Rainer Muller ◽  
Wolfgang Schroder-Preikschat ◽  
Wanja Hofer ◽  
Daniel Lohmann
Keyword(s):  
Memory Protection

scholarly journals Poly(propylene imine) dendrimers with histidine-maltose shell as novel type of nanoparticles for synapse and memory protection

2019 ◽  
Vol 17 ◽  
pp. 198-209 ◽  
Author(s):  
Ester Aso ◽  
Isak Martinsson ◽  
Dietmar Appelhans ◽  
Christiane Effenberg ◽  
Nuria Benseny-Cases ◽  
...  
Keyword(s):  
Memory Protection ◽  
Poly Propylene

scholarly journals Configurable memory protection by aspects

2007 ◽  
Author(s):  
Daniel Lohmann ◽  
Jochen Streicher ◽  
Wanja Hofer ◽  
Olaf Spinczyk ◽  
Wolfgang Schröder-Preikschat
Keyword(s):  
Memory Protection

scholarly journals Two Dimensional Parity Check with Variable Length Error Detection Code for the Non-Volatile Memory of Smart Data

2018 ◽  
Vol 8 (8) ◽  
pp. 1211 ◽  
Author(s):  
Cihun-Siyong Gong ◽  
Yung-Chang Chang ◽  
Li-Ren Huang ◽  
Chih-Jen Yang ◽  
Kung-Ming Ji ◽  
...  
Keyword(s):  
Error Detection ◽  
Cosmic Ray ◽  
Variable Length ◽  
Automotive Electronics ◽  
Two Dimensional ◽  
Memory Protection ◽  
Non Volatile Memory ◽  
Smart Data ◽  
Volatile Memory ◽  
Detection Quality

This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic ray, a two-dimensional parity with variable length error detection code (2D-VLEDC) for memory protection is proposed. 2D-VLEDC has the feature of variable length of redundant bits varied with content of data word in the NVM. The experimental results show that the same error detection quality could be achieved with a 30% redundancy improvement by applying the proposed 2D-VLEDC. The proposed design is particularly suitable for the use of safety-related fields, such as the automotive electronics and industrial non-volatile memories involved in the industrial automation.

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