Reliability investigation of metal-semiconductor diodes in an E/D pHEMT process

[Reliability of Compound Semiconductors] ROCS Workshop, 2005. ◽

10.1109/rocs.2005.201564 ◽

2005 ◽

Author(s):

S. Somisetty ◽

P. Ersland ◽

Xinxing Yang

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