Reverse Noise Measurement and Use in Device Characterization

Author(s):  
J. Randa ◽  
T. McKay ◽  
S.L. Sweeney ◽  
D.K. Walker ◽  
L. Wagner ◽  
...  
2013 ◽  
Vol E96.C (2) ◽  
pp. 241-244
Author(s):  
Ryuta YAMANAKA ◽  
Taka FUJITA ◽  
Hideyuki SOTOBAYASHI ◽  
Atsushi KANNO ◽  
Tetsuya KAWANISHI

1992 ◽  
Author(s):  
J. A. Molnar ◽  
T. V. Mai ◽  
J. J. O'Neill
Keyword(s):  

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