Degradation mechanism of GaAs PHEMT power amplifiers under elevated temperature lifetest with RF-overdrive
2020 ◽
Vol 2020.55
(0)
◽
pp. 152_paper
Keyword(s):
2020 ◽
Vol 2020.55
(0)
◽
pp. 166_paper
Keyword(s):
2014 ◽
Vol 2014
◽
pp. 1-5
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1978 ◽
Vol 36
(1)
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pp. 658-659
1988 ◽
Vol 46
◽
pp. 550-551