Modeling of substrate related extrinsic oxide failure distributions

2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) ◽

10.1109/relphy.2002.996669 ◽

2003 ◽

Cited By ~ 3

Author(s):

T. Pompl ◽

M. Kerber ◽

G. Innertsberger ◽

K.-H. Allers ◽

M. Obry ◽

...

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