MEMS reliability in a vibration environment

2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) ◽

10.1109/relphy.2000.843904 ◽

2002 ◽

Cited By ~ 13

Author(s):

D.M. Tanner ◽

J.A. Walraven ◽

K.S. Helgesen ◽

L.W. Irwin ◽

D.L. Gregory ◽

...

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